Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

M. Buonomo*, L. Torto, M. Barbato, N. Wrachien, A. Rizzo, S.A. Gevorgyan, F.C. Krebs, A. Cester

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.
Original languageEnglish
JournalMicroelectronics Reliability
Volume88-90
Pages (from-to)878-881
ISSN0026-2714
DOIs
Publication statusPublished - 2018
Event29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Aalborg, Denmark
Duration: 1 Oct 20185 Oct 2018
Conference number: 29
http://www.esref2018conf.org/

Conference

Conference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Number29
Country/TerritoryDenmark
CityAalborg
Period01/10/201805/10/2018
Internet address

Keywords

  • Organic solar cells
  • Electrostatic discharge
  • Transmission Line Pulse
  • Parasitic shunt

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