Abstract
We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.
Original language | English |
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Journal | Microelectronics Reliability |
Volume | 88-90 |
Pages (from-to) | 878-881 |
ISSN | 0026-2714 |
DOIs | |
Publication status | Published - 2018 |
Event | 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Aalborg, Denmark Duration: 1 Oct 2018 → 5 Oct 2018 Conference number: 29 http://www.esref2018conf.org/ |
Conference
Conference | 29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
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Number | 29 |
Country/Territory | Denmark |
City | Aalborg |
Period | 01/10/2018 → 05/10/2018 |
Internet address |
Keywords
- Organic solar cells
- Electrostatic discharge
- Transmission Line Pulse
- Parasitic shunt