Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

M. Buonomo*, L. Torto, M. Barbato, N. Wrachien, A. Rizzo, S.A. Gevorgyan, F.C. Krebs, A. Cester

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.
Original languageEnglish
JournalMicroelectronics Reliability
Volume88-90
Pages (from-to)878-881
ISSN0026-2714
DOIs
Publication statusPublished - 2018
Event29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ) - Aalborg, Denmark
Duration: 1 Oct 20185 Oct 2018
Conference number: 29
http://www.esref2018conf.org/

Conference

Conference29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )
Number29
CountryDenmark
CityAalborg
Period01/10/201805/10/2018
Internet address

Keywords

  • Organic solar cells
  • Electrostatic discharge
  • Transmission Line Pulse
  • Parasitic shunt

Cite this

Buonomo, M., Torto, L., Barbato, M., Wrachien, N., Rizzo, A., Gevorgyan, S. A., ... Cester, A. (2018). Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique. Microelectronics Reliability, 88-90, 878-881. https://doi.org/10.1016/j.microrel.2018.06.059
Buonomo, M. ; Torto, L. ; Barbato, M. ; Wrachien, N. ; Rizzo, A. ; Gevorgyan, S.A. ; Krebs, F.C. ; Cester, A. / Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique. In: Microelectronics Reliability. 2018 ; Vol. 88-90. pp. 878-881.
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title = "Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique",
abstract = "We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.",
keywords = "Organic solar cells, Electrostatic discharge, Transmission Line Pulse, Parasitic shunt",
author = "M. Buonomo and L. Torto and M. Barbato and N. Wrachien and A. Rizzo and S.A. Gevorgyan and F.C. Krebs and A. Cester",
year = "2018",
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language = "English",
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pages = "878--881",
journal = "Microelectronics Reliability",
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Buonomo, M, Torto, L, Barbato, M, Wrachien, N, Rizzo, A, Gevorgyan, SA, Krebs, FC & Cester, A 2018, 'Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique', Microelectronics Reliability, vol. 88-90, pp. 878-881. https://doi.org/10.1016/j.microrel.2018.06.059

Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique. / Buonomo, M.; Torto, L.; Barbato, M.; Wrachien, N.; Rizzo, A.; Gevorgyan, S.A.; Krebs, F.C.; Cester, A.

In: Microelectronics Reliability, Vol. 88-90, 2018, p. 878-881.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Analysis of the effects of voltage pulses on P3HT:PCBM polymeric solar cells by means of TLP technique

AU - Buonomo, M.

AU - Torto, L.

AU - Barbato, M.

AU - Wrachien, N.

AU - Rizzo, A.

AU - Gevorgyan, S.A.

AU - Krebs, F.C.

AU - Cester, A.

PY - 2018

Y1 - 2018

N2 - We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.

AB - We have studied the effects of an Electrostatic discharge stress on polymeric solar cells, employing P3HT:PCBM as active layer. All the analyzed devices featured a behavior strongly related to the evolution of the internal parasitic paths. We found that the degradation of the organic solar cells during the stress is related to the initial shunt condition. In addition, no breakdown occurred during the stress and only minor changes are visible from the photocurrent characteristics.

KW - Organic solar cells

KW - Electrostatic discharge

KW - Transmission Line Pulse

KW - Parasitic shunt

U2 - 10.1016/j.microrel.2018.06.059

DO - 10.1016/j.microrel.2018.06.059

M3 - Journal article

VL - 88-90

SP - 878

EP - 881

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -