Analysis of residual stress gradients in thin films using Seemann-Bohlin-X-ray diffraction

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@article{9d94a5a9a8874409b217739bcd0cb528,

title = "Analysis of residual stress gradients in thin films using Seemann-Bohlin-X-ray diffraction",

keywords = "Materials technology",

author = "Karen Pantleon and Heinrich Oettel",

year = "1996",

language = "English",

volume = "228-231",

pages = "301--306",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Scientific.Net",

}