Analysis of neutron and x-ray reflectivity data. I. Theory

I.W. Hamley; J.S. Pedersen

doi:10.1107/S0021889893006260

Analysis of neutron and x-ray reflectivity data. I. Theory

I.W. Hamley, J.S. Pedersen

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.

Original language	English
Journal	Journal of Applied Crystallography
Volume	27
Issue number	1
Pages (from-to)	29-35
ISSN	0021-8898
DOIs	https://doi.org/10.1107/S0021889893006260
Publication status	Published - 1994

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abstract = "Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.",

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AU - Pedersen, J.S.

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AB - Different methods and approximations for calculating reflectivity curves from scattering-length density profiles are carefully discussed and compared. Dynamical theory and the approximations leading to single-scattering dynamical theory, kinematical theory with an optical path-length correction and kinematical theory with refraction corrections are described. The differences are illustrated by calculations for model profiles for which dynamical effects are important.

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M3 - Journal article

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JO - Journal of Applied Crystallography

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Analysis of neutron and x-ray reflectivity data. I. Theory

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