Analysis of mode-hopping effect in Fabry–Pérot multiple-quantum well laser diodes via low frequency noise investigation

Sandra Pralgauskaitė; Vilius Palenskis; Jonas Matukas; Bronius Šaulys; Vladimir Kornijčuk; Vadimas Verdingovas

doi:10.1016/j.sse.2012.07.021

Analysis of mode-hopping effect in Fabry–Pérot multiple-quantum well laser diodes via low frequency noise investigation

Sandra Pralgauskaitė, Vilius Palenskis, Jonas Matukas, Bronius Šaulys, Vladimir Kornijčuk, Vadimas Verdingovas

Vilnius University

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Comprehensive investigation of noise characteristics and radiation spectrum with special attention to the mode-hopping effect of Fabry–Pérot (FP) multiple quantum well laser diodes (LDs) have been carried out: laser radiation spectra, optical and electrical fluctuations and cross-correlation factor between them have been measured under stable and mode-hopping operation. At the mode-hopping that occurs at particular operation conditions (injection current and temperature) LD radiation spectrum is unstable in time, very intensive and highly correlated Lorentzian-type optical and electrical fluctuations are observed. Characteristic time of physical processes that take part in LD structure during mode-hopping is ranged from microseconds to milliseconds. These processes are caused by the carrier generation and recombination in the centers formed by the defects in barrier layer (in the active region).

Original language	English
Journal	Solid-State Electronics
Volume	79
Pages (from-to)	104-110
ISSN	0038-1101
DOIs	https://doi.org/10.1016/j.sse.2012.07.021
Publication status	Published - 2013

Keywords

Cross-correlation factor
Electrical noise
Fluctuation
Laser diode
Mode-hopping
Optical noise

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10.1016/j.sse.2012.07.021

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@article{1c3ad6416734440b8d4c1cb777fdf51e,

title = "Analysis of mode-hopping effect in Fabry–P{\'e}rot multiple-quantum well laser diodes via low frequency noise investigation",

abstract = "Comprehensive investigation of noise characteristics and radiation spectrum with special attention to the mode-hopping effect of Fabry–P{\'e}rot (FP) multiple quantum well laser diodes (LDs) have been carried out: laser radiation spectra, optical and electrical fluctuations and cross-correlation factor between them have been measured under stable and mode-hopping operation. At the mode-hopping that occurs at particular operation conditions (injection current and temperature) LD radiation spectrum is unstable in time, very intensive and highly correlated Lorentzian-type optical and electrical fluctuations are observed. Characteristic time of physical processes that take part in LD structure during mode-hopping is ranged from microseconds to milliseconds. These processes are caused by the carrier generation and recombination in the centers formed by the defects in barrier layer (in the active region).",

keywords = "Cross-correlation factor, Electrical noise, Fluctuation, Laser diode, Mode-hopping, Optical noise",

author = "Sandra Pralgauskaitė and Vilius Palenskis and Jonas Matukas and Bronius {\v S}aulys and Vladimir Kornij{\v c}uk and Vadimas Verdingovas",

year = "2013",

doi = "10.1016/j.sse.2012.07.021",

language = "English",

volume = "79",

pages = "104--110",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Pergamon Press",

}

TY - JOUR

T1 - Analysis of mode-hopping effect in Fabry–Pérot multiple-quantum well laser diodes via low frequency noise investigation

AU - Pralgauskaitė, Sandra

AU - Palenskis, Vilius

AU - Matukas, Jonas

AU - Šaulys, Bronius

AU - Kornijčuk, Vladimir

AU - Verdingovas, Vadimas

PY - 2013

Y1 - 2013

N2 - Comprehensive investigation of noise characteristics and radiation spectrum with special attention to the mode-hopping effect of Fabry–Pérot (FP) multiple quantum well laser diodes (LDs) have been carried out: laser radiation spectra, optical and electrical fluctuations and cross-correlation factor between them have been measured under stable and mode-hopping operation. At the mode-hopping that occurs at particular operation conditions (injection current and temperature) LD radiation spectrum is unstable in time, very intensive and highly correlated Lorentzian-type optical and electrical fluctuations are observed. Characteristic time of physical processes that take part in LD structure during mode-hopping is ranged from microseconds to milliseconds. These processes are caused by the carrier generation and recombination in the centers formed by the defects in barrier layer (in the active region).

AB - Comprehensive investigation of noise characteristics and radiation spectrum with special attention to the mode-hopping effect of Fabry–Pérot (FP) multiple quantum well laser diodes (LDs) have been carried out: laser radiation spectra, optical and electrical fluctuations and cross-correlation factor between them have been measured under stable and mode-hopping operation. At the mode-hopping that occurs at particular operation conditions (injection current and temperature) LD radiation spectrum is unstable in time, very intensive and highly correlated Lorentzian-type optical and electrical fluctuations are observed. Characteristic time of physical processes that take part in LD structure during mode-hopping is ranged from microseconds to milliseconds. These processes are caused by the carrier generation and recombination in the centers formed by the defects in barrier layer (in the active region).

KW - Cross-correlation factor

KW - Electrical noise

KW - Fluctuation

KW - Laser diode

KW - Mode-hopping

KW - Optical noise

U2 - 10.1016/j.sse.2012.07.021

DO - 10.1016/j.sse.2012.07.021

M3 - Journal article

SN - 0038-1101

VL - 79

SP - 104

EP - 110

JO - Solid-State Electronics

JF - Solid-State Electronics

ER -

Analysis of mode-hopping effect in Fabry–Pérot multiple-quantum well laser diodes via low frequency noise investigation

Abstract

Keywords

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