Analysis of microstructural evolution driven by production bias

C.H. Woo, A.A. Semenov, B.N. Singh

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    Original languageEnglish
    Publication date1992
    Publication statusPublished - 1992
    EventWorkshop on time dependence of radiation damage accumulation and its impact on materials properties - Montreux, Switzerland
    Duration: 13 Oct 199219 Oct 1992

    Workshop

    WorkshopWorkshop on time dependence of radiation damage accumulation and its impact on materials properties
    CountrySwitzerland
    CityMontreux
    Period13/10/199219/10/1992

    Cite this

    Woo, C. H., Semenov, A. A., & Singh, B. N. (1992). Analysis of microstructural evolution driven by production bias. Abstract from Workshop on time dependence of radiation damage accumulation and its impact on materials properties, Montreux, Switzerland.
    Woo, C.H. ; Semenov, A.A. ; Singh, B.N. / Analysis of microstructural evolution driven by production bias. Abstract from Workshop on time dependence of radiation damage accumulation and its impact on materials properties, Montreux, Switzerland.
    @conference{603f6526b8184417816ac526388ce011,
    title = "Analysis of microstructural evolution driven by production bias",
    keywords = "Avancerede materialer og materialeteknologi",
    author = "C.H. Woo and A.A. Semenov and B.N. Singh",
    year = "1992",
    language = "English",
    note = "Workshop on time dependence of radiation damage accumulation and its impact on materials properties ; Conference date: 13-10-1992 Through 19-10-1992",

    }

    Woo, CH, Semenov, AA & Singh, BN 1992, 'Analysis of microstructural evolution driven by production bias' Workshop on time dependence of radiation damage accumulation and its impact on materials properties, Montreux, Switzerland, 13/10/1992 - 19/10/1992, .

    Analysis of microstructural evolution driven by production bias. / Woo, C.H.; Semenov, A.A.; Singh, B.N.

    1992. Abstract from Workshop on time dependence of radiation damage accumulation and its impact on materials properties, Montreux, Switzerland.

    Research output: Contribution to conferenceConference abstract for conferenceResearch

    TY - ABST

    T1 - Analysis of microstructural evolution driven by production bias

    AU - Woo, C.H.

    AU - Semenov, A.A.

    AU - Singh, B.N.

    PY - 1992

    Y1 - 1992

    KW - Avancerede materialer og materialeteknologi

    M3 - Conference abstract for conference

    ER -

    Woo CH, Semenov AA, Singh BN. Analysis of microstructural evolution driven by production bias. 1992. Abstract from Workshop on time dependence of radiation damage accumulation and its impact on materials properties, Montreux, Switzerland.