Original language | English |
---|---|
Journal | Quality and Reliability Engineering International |
Volume | 16 |
Pages (from-to) | 173-186 |
ISSN | 0748-8017 |
Publication status | Published - 2000 |
Analysis of Integrated Circuit Fault Data Using Generalised Linear Models
C. K. Hansen, Poul Thyregod
Research output: Contribution to journal › Journal article › Research › peer-review