Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling

Lorenzo Torto, Antonio Rizzo, Andrea Cester, Nicola Wrachien, Luigi Passarini, Frederik C Krebs, Michael Corazza, Suren A. Gevorgyan

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime. The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.
Original languageEnglish
Title of host publicationProceedings of the IEEE International Reliability Physics Symposium (IRPS 2017)
Number of pages10
PublisherIEEE
Publication date2017
Article number2F-4
ISBN (Print)978-1-5090-6640-7
DOIs
Publication statusPublished - 2017
Event2017 IEEE International Reliability Physics Symposium - Monterey, United States
Duration: 2 Apr 20176 Apr 2017
http://irps.org/

Conference

Conference2017 IEEE International Reliability Physics Symposium
CountryUnited States
CityMonterey
Period02/04/201706/04/2017
Internet address

Keywords

  • Organic solar cell reliability
  • Photocurrent models
  • Carrier lifetime

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