Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling

Lorenzo Torto; Antonio Rizzo; Andrea Cester; Nicola Wrachien; Luigi Passarini; Frederik C Krebs; Michael Corazza; Suren A. Gevorgyan

doi:10.1109/IRPS.2017.7936274

Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling

Lorenzo Torto, Antonio Rizzo, Andrea Cester, Nicola Wrachien, Luigi Passarini, Frederik C Krebs, Michael Corazza, Suren A. Gevorgyan

Department of Energy Conversion and Storage

University of Padua

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Abstract

We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime. The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.

Original language	English
Title of host publication	Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017)
Number of pages	10
Publisher	IEEE
Publication date	2017
Article number	2F-4
ISBN (Print)	978-1-5090-6640-7
DOIs	https://doi.org/10.1109/IRPS.2017.7936274
Publication status	Published - 2017
Event	2017 IEEE International Reliability Physics Symposium - Monterey, United States Duration: 2 Apr 2017 → 6 Apr 2017 http://irps.org/

Conference

Conference	2017 IEEE International Reliability Physics Symposium
Country/Territory	United States
City	Monterey
Period	02/04/2017 → 06/04/2017
Internet address	http://irps.org/

Keywords

Organic solar cell reliability
Photocurrent models
Carrier lifetime

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10.1109/IRPS.2017.7936274

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Torto, L., Rizzo, A., Cester, A., Wrachien, N., Passarini, L., Krebs, F. C., Corazza, M., & Gevorgyan, S. A. (2017). Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling. In Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017) Article 2F-4 IEEE. https://doi.org/10.1109/IRPS.2017.7936274

@inproceedings{efb16317955749b6baca2b17b04d3896,

title = "Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling",

abstract = "We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime. The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.",

keywords = "Organic solar cell reliability, Photocurrent models, Carrier lifetime",

author = "Lorenzo Torto and Antonio Rizzo and Andrea Cester and Nicola Wrachien and Luigi Passarini and Krebs, {Frederik C} and Michael Corazza and Gevorgyan, {Suren A.}",

year = "2017",

doi = "10.1109/IRPS.2017.7936274",

language = "English",

isbn = "978-1-5090-6640-7",

booktitle = "Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017)",

publisher = "IEEE",

address = "United States",

note = "2017 IEEE International Reliability Physics Symposium , IRPS 2017 ; Conference date: 02-04-2017 Through 06-04-2017",

url = "http://irps.org/",

}

Torto, L, Rizzo, A, Cester, A, Wrachien, N, Passarini, L, Krebs, FC, Corazza, M & Gevorgyan, SA 2017, Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling. in Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017)., 2F-4, IEEE, 2017 IEEE International Reliability Physics Symposium , Monterey, California, United States, 02/04/2017. https://doi.org/10.1109/IRPS.2017.7936274

Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling. / Torto, Lorenzo; Rizzo, Antonio; Cester, Andrea et al.
Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017). IEEE, 2017. 2F-4.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling

AU - Torto, Lorenzo

AU - Rizzo, Antonio

AU - Cester, Andrea

AU - Wrachien, Nicola

AU - Passarini, Luigi

AU - Krebs, Frederik C

AU - Corazza, Michael

AU - Gevorgyan, Suren A.

PY - 2017

Y1 - 2017

N2 - We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime. The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.

AB - We investigated the effects of electrical stress and thermal storage by means of photocurrent, Impedance Spectroscopy and Open Circuit Voltage Decay models. The electrical stress damages only the active layer, by reducing the generation rate, the polaron separation probability and the carrier lifetime. The thermal stress also degrades the anode interface. This reflects on the appearance of an inflection in the I-V photocurrent shape close to the operative region.

KW - Organic solar cell reliability

KW - Photocurrent models

KW - Carrier lifetime

U2 - 10.1109/IRPS.2017.7936274

DO - 10.1109/IRPS.2017.7936274

M3 - Article in proceedings

SN - 978-1-5090-6640-7

BT - Proceedings of the IEEE International Reliability Physics Symposium (IRPS 2017)

PB - IEEE

T2 - 2017 IEEE International Reliability Physics Symposium

Y2 - 2 April 2017 through 6 April 2017

ER -

Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling

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