Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques

Oleg Mishin, Alexander Godfrey, Dorte Juul Jensen

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationElectron Backscatter Diffraction in Materials Science
    EditorsA.J. Schwartz, M. Kumar, D.P. Field, B.L. Adams
    Number of pages428
    PublisherSpringer Science+Business Media
    Publication date2009
    ISBN (Print)978-0-387-88135-5
    Publication statusPublished - 2009


    • Materials characterization and modelling
    • Materials research

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