Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques

Oleg Mishin, Alexander Godfrey, Dorte Juul Jensen

    Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review

    Original languageEnglish
    Title of host publicationElectron Backscatter Diffraction in Materials Science
    EditorsA.J. Schwartz, M. Kumar, D.P. Field, B.L. Adams
    Number of pages428
    PublisherSpringer Science+Business Media
    Publication date2009
    Edition2
    Pages263-275
    ISBN (Print)978-0-387-88135-5
    Publication statusPublished - 2009

    Keywords

    • Materials characterization and modelling
    • Materials research

    Cite this

    Mishin, O., Godfrey, A., & Juul Jensen, D. (2009). Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques. In A. J. Schwartz, M. Kumar, D. P. Field, & B. L. Adams (Eds.), Electron Backscatter Diffraction in Materials Science (2 ed., pp. 263-275). Springer Science+Business Media.