Analysis of contaminated field failure data for repairable systems

Christian Kornerup Hansen; Poul Thyregod

doi:10.1109/ARMS.1991.154506

Analysis of contaminated field failure data for repairable systems

Christian Kornerup Hansen, Poul Thyregod

Technical University of Denmark

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

A simple model for electronic systems with repair, and a method for analyzing recorded field failure data for such systems are presented. The work performed has resulted in analytical results that may be used for assessing the product reliability. The method was originally developed for use under ideal circumstances, but it has been adapted for use with contaminated data (i.e., data where the failure times are observed embedded by noise). A simple model for the noise that enables an analytical solution for the mean cumulative number of failures is proposed. The method is illustrated by an example of industrial failure data. The effect caused by contamination in this data is investigated under a worst case assumption. The example indicates that the model is robust to contamination

Original language	English
Title of host publication	Proceedings of the Annual Reliability and Maintainability Symposium
Publisher	IEEE
Publication date	1991
Pages	604-609
ISBN (Print)	0-87942-661-6
DOIs	https://doi.org/10.1109/ARMS.1991.154506
Publication status	Published - 1991
Event	Annual Reliability and Maintainability Symposium - Orlando, United States Duration: 29 Jan 1991 → 31 Jan 1991

Conference

Conference	Annual Reliability and Maintainability Symposium
Country/Territory	United States
City	Orlando
Period	29/01/1991 → 31/01/1991

Bibliographical note

Copyright 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

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abstract = "A simple model for electronic systems with repair, and a method for analyzing recorded field failure data for such systems are presented. The work performed has resulted in analytical results that may be used for assessing the product reliability. The method was originally developed for use under ideal circumstances, but it has been adapted for use with contaminated data (i.e., data where the failure times are observed embedded by noise). A simple model for the noise that enables an analytical solution for the mean cumulative number of failures is proposed. The method is illustrated by an example of industrial failure data. The effect caused by contamination in this data is investigated under a worst case assumption. The example indicates that the model is robust to contamination",

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N2 - A simple model for electronic systems with repair, and a method for analyzing recorded field failure data for such systems are presented. The work performed has resulted in analytical results that may be used for assessing the product reliability. The method was originally developed for use under ideal circumstances, but it has been adapted for use with contaminated data (i.e., data where the failure times are observed embedded by noise). A simple model for the noise that enables an analytical solution for the mean cumulative number of failures is proposed. The method is illustrated by an example of industrial failure data. The effect caused by contamination in this data is investigated under a worst case assumption. The example indicates that the model is robust to contamination

AB - A simple model for electronic systems with repair, and a method for analyzing recorded field failure data for such systems are presented. The work performed has resulted in analytical results that may be used for assessing the product reliability. The method was originally developed for use under ideal circumstances, but it has been adapted for use with contaminated data (i.e., data where the failure times are observed embedded by noise). A simple model for the noise that enables an analytical solution for the mean cumulative number of failures is proposed. The method is illustrated by an example of industrial failure data. The effect caused by contamination in this data is investigated under a worst case assumption. The example indicates that the model is robust to contamination

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M3 - Article in proceedings

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BT - Proceedings of the Annual Reliability and Maintainability Symposium

PB - IEEE

T2 - Annual Reliability and Maintainability Symposium

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ER -

Analysis of contaminated field failure data for repairable systems

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