Analysis of contaminated field failure data for repairable systems

Christian Kornerup Hansen, Poul Thyregod

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    456 Downloads (Pure)

    Abstract

    A simple model for electronic systems with repair, and a method for analyzing recorded field failure data for such systems are presented. The work performed has resulted in analytical results that may be used for assessing the product reliability. The method was originally developed for use under ideal circumstances, but it has been adapted for use with contaminated data (i.e., data where the failure times are observed embedded by noise). A simple model for the noise that enables an analytical solution for the mean cumulative number of failures is proposed. The method is illustrated by an example of industrial failure data. The effect caused by contamination in this data is investigated under a worst case assumption. The example indicates that the model is robust to contamination
    Original languageEnglish
    Title of host publicationProceedings of the Annual Reliability and Maintainability Symposium
    PublisherIEEE
    Publication date1991
    Pages604-609
    ISBN (Print)0-87942-661-6
    DOIs
    Publication statusPublished - 1991
    EventAnnual Reliability and Maintainability Symposium - Orlando, FL
    Duration: 1 Jan 1991 → …

    Conference

    ConferenceAnnual Reliability and Maintainability Symposium
    CityOrlando, FL
    Period01/01/1991 → …

    Bibliographical note

    Copyright 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

    Fingerprint Dive into the research topics of 'Analysis of contaminated field failure data for repairable systems'. Together they form a unique fingerprint.

    Cite this