Analysis and Modeling of Integrated Magnetics for LLC resonant Converters

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedings – Annual report year: 2017Researchpeer-review

View graph of relations

Shunt-inserted transformers are widely used toobtain high leakage inductance. This paper investigates thismethod in depth to make it applicable to integrate resonantinductor for the LLC resonant converters. The analysis andmodel of magnetizing inductance and leakage inductance forshunt-inserted planar transformers with and without air gaps arepresented. Magnetic shunt permeability and thicknesssignificantly affect the magnetizing inductance and leakageinductance. Air gaps in traditional transformers only have aslight influence on the leakage inductance. However, air gaps inshunt-inserted planar transformers can provide a significantdifference. The way to obtain the desirable magnetizing andleakage inductance value for LLC resonant converters issimplified by the creation of air gaps together with a magneticshunt. The calculation and relation are validated by finiteelement analysis (FEA) simulations and experimentalmeasurements. AC resistances for the shunt-inserted planartransformers are discussed and three transformers with the samemagnetizing inductance are selected for comparison. The resultsindicate that the magnetic shunt can in some extent minimizefringing effects.
Original languageEnglish
Title of host publicationProceedings of the 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017)
PublisherIEEE
Publication date2017
Pages834-839
ISBN (Electronic)978-1-5386-1126-5
DOIs
Publication statusPublished - 2017
Event43rd Annual Conference of the IEEE Industrial Electronics Society - China National Convention Center, Beijing, China
Duration: 29 Oct 20171 Nov 2017

Conference

Conference43rd Annual Conference of the IEEE Industrial Electronics Society
LocationChina National Convention Center
CountryChina
CityBeijing
Period29/10/201701/11/2017
CitationsWeb of Science® Times Cited: No match on DOI

ID: 141011766