An efficient forward scattering model, based on the Method of Auxiliary Sources, is formulated for perfectly electrically conducting (PEC) and penetrable nanowires on dielectric substrates. The accuracy of the model is investigated parametrically, with emphasis on future application in an inverse scattering scheme. The model is tested on families of PEC and silver nanowires on silicon substrate.
|Journal||Journal of the European Optical Society: Rapid Publications|
|Publication status||Published - 2011|