All-Optical Wavelength Conversion of a High-Speed RZ-OOK Signal in a Silicon Nanowire

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Abstract

All-optical wavelength conversion of a 320 Gb/s line-rate RZ-OOK signal is demonstrated based on four-wave mixing in a 3.6 mm long silicon nanowire. Bit error rate measurements validate the performance within FEC limits.
Original languageEnglish
Title of host publication2011 IEEE Photonics Conference
PublisherIEEE
Publication date2011
Pages595-596
ISBN (Print)978-1-4244-8940-4
DOIs
Publication statusPublished - 2011
EventIEEE Photonics Conference 2011 - Arlington, United States
Duration: 9 Oct 201113 Oct 2011

Conference

ConferenceIEEE Photonics Conference 2011
CountryUnited States
CityArlington
Period09/10/201113/10/2011

Bibliographical note

Oral presentation.

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