Abstract
All-optical wavelength conversion of a 320 Gb/s line-rate RZ-OOK signal is demonstrated based on four-wave mixing in a 3.6 mm long silicon nanowire. Bit error rate measurements validate the performance within FEC limits.
Original language | English |
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Title of host publication | 2011 IEEE Photonics Conference |
Publisher | IEEE |
Publication date | 2011 |
Pages | 595-596 |
ISBN (Print) | 978-1-4244-8940-4 |
DOIs | |
Publication status | Published - 2011 |
Event | IEEE Photonics Conference 2011 - Arlington, United States Duration: 9 Oct 2011 → 13 Oct 2011 |
Conference
Conference | IEEE Photonics Conference 2011 |
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Country/Territory | United States |
City | Arlington |
Period | 09/10/2011 → 13/10/2011 |