Alignment of sample position and rotation during in situ synchrotron X‐ray micro‐diffraction experiments using a Laue cross‐correlation approach

Chenglu Zhang, Yubin Zhang, Guilin Wu, Wenjun Liu, Ruqing Xu, Dorte Juul Jensen, Andrew William Godfrey

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Abstract

Laue micro‐diffraction has proven to be able to reveal material properties at the sub‐grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three‐dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused‐beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X‐ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ∼0.01°. The proposed method is fast to implement and does not require the use of additional surface markers.
Original languageEnglish
JournalJournal of Applied Crystallography
Volume52
Issue number5
Number of pages9
ISSN0021-8898
DOIs
Publication statusPublished - 2019

Bibliographical note

GA no. 788567

Keywords

  • X-ray micro-diffraction
  • Differential aperture X-ray microscopy
  • DAXM
  • In situ deformation
  • Sample alignment
  • Digital image correlation
  • DIC

Cite this

@article{7fec1e2dc18c4133823c273300a8f1e8,
title = "Alignment of sample position and rotation during in situ synchrotron X‐ray micro‐diffraction experiments using a Laue cross‐correlation approach",
abstract = "Laue micro‐diffraction has proven to be able to reveal material properties at the sub‐grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three‐dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused‐beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X‐ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ∼0.01°. The proposed method is fast to implement and does not require the use of additional surface markers.",
keywords = "X-ray micro-diffraction, Differential aperture X-ray microscopy, DAXM, In situ deformation, Sample alignment, Digital image correlation, DIC",
author = "Chenglu Zhang and Yubin Zhang and Guilin Wu and Wenjun Liu and Ruqing Xu and {Juul Jensen}, Dorte and Godfrey, {Andrew William}",
note = "GA no. 788567",
year = "2019",
doi = "10.1107/S1600576719010562",
language = "English",
volume = "52",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "Wiley-Blackwell",
number = "5",

}

Alignment of sample position and rotation during in situ synchrotron X‐ray micro‐diffraction experiments using a Laue cross‐correlation approach. / Zhang, Chenglu; Zhang, Yubin; Wu, Guilin; Liu, Wenjun; Xu, Ruqing; Juul Jensen, Dorte; Godfrey, Andrew William.

In: Journal of Applied Crystallography, Vol. 52, No. 5, 2019.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Alignment of sample position and rotation during in situ synchrotron X‐ray micro‐diffraction experiments using a Laue cross‐correlation approach

AU - Zhang, Chenglu

AU - Zhang, Yubin

AU - Wu, Guilin

AU - Liu, Wenjun

AU - Xu, Ruqing

AU - Juul Jensen, Dorte

AU - Godfrey, Andrew William

N1 - GA no. 788567

PY - 2019

Y1 - 2019

N2 - Laue micro‐diffraction has proven to be able to reveal material properties at the sub‐grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three‐dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused‐beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X‐ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ∼0.01°. The proposed method is fast to implement and does not require the use of additional surface markers.

AB - Laue micro‐diffraction has proven to be able to reveal material properties at the sub‐grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three‐dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused‐beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X‐ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ∼0.01°. The proposed method is fast to implement and does not require the use of additional surface markers.

KW - X-ray micro-diffraction

KW - Differential aperture X-ray microscopy

KW - DAXM

KW - In situ deformation

KW - Sample alignment

KW - Digital image correlation

KW - DIC

U2 - 10.1107/S1600576719010562

DO - 10.1107/S1600576719010562

M3 - Journal article

VL - 52

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

IS - 5

ER -