Algorithms and instrumentation for generating 3D grain maps in polycrystals by 3DXRD

E. Knudsen; H.F. Poulsen; Søren Schmidt; H.O. Sørensen; E.M. Lauridsen; T. Markussen; X. Fu

Algorithms and instrumentation for generating 3D grain maps in polycrystals by 3DXRD

E. Knudsen, H.F. Poulsen, Søren Schmidt, H.O. Sørensen, E.M. Lauridsen, T. Markussen, X. Fu

Research output: Contribution to conference › Conference abstract for conference › Research

Original language	English
Publication date	2005
Publication status	Published - 2005
Event	CEPHEUS workshop on advanced method for interpretation of TEM, X-ray and SIMS measurements in nano- and atomic scale - Warsaw (PL), 1-3 Jun Duration: 1 Jan 2005 → …

Conference

Conference	CEPHEUS workshop on advanced method for interpretation of TEM, X-ray and SIMS measurements in nano- and atomic scale
City	Warsaw (PL), 1-3 Jun
Period	01/01/2005 → …

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title = "Algorithms and instrumentation for generating 3D grain maps in polycrystals by 3DXRD",

keywords = "7-I poly",

author = "E. Knudsen and H.F. Poulsen and S{\o}ren Schmidt and H.O. S{\o}rensen and E.M. Lauridsen and T. Markussen and X. Fu",

year = "2005",

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note = "CEPHEUS workshop on advanced method for interpretation of TEM, X-ray and SIMS measurements in nano- and atomic scale ; Conference date: 01-01-2005",

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Algorithms and instrumentation for generating 3D grain maps in polycrystals by 3DXRD. / Knudsen, E.; Poulsen, H.F.; Schmidt, Søren et al.
2005. Abstract from CEPHEUS workshop on advanced method for interpretation of TEM, X-ray and SIMS measurements in nano- and atomic scale, Warsaw (PL), 1-3 Jun.

Research output: Contribution to conference › Conference abstract for conference › Research

TY - ABST

T1 - Algorithms and instrumentation for generating 3D grain maps in polycrystals by 3DXRD

AU - Knudsen, E.

AU - Poulsen, H.F.

AU - Schmidt, Søren

AU - Sørensen, H.O.

AU - Lauridsen, E.M.

AU - Markussen, T.

AU - Fu, X.

PY - 2005

Y1 - 2005

KW - 7-I poly

M3 - Conference abstract for conference

T2 - CEPHEUS workshop on advanced method for interpretation of TEM, X-ray and SIMS measurements in nano- and atomic scale

Y2 - 1 January 2005

ER -