Advanced Characterization of Semiconductors using Microprobes

    Research output: Book/ReportPh.D. thesis

    Original languageEnglish
    Place of PublicationKgs. Lyngby, Denmark
    PublisherTechnical University of Denmark
    Publication statusPublished - Jan 2010

    Projects

    Advanced Characterization of Semiconductors using Microprobes

    Petersen, D. H., Bøggild, P., Nielsen, P. F., Vandervorst, W., Thomsen, E. V., Hofmann, P., Koon, D. W. & Hansen, O.

    DTU, Samfinansiering

    15/12/200620/01/2010

    Project: PhD

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