Abstract
Major faults in the commissioning phase of refrigeration systems are caused by defects related to sensors. With a number of similar sensors available that do not differ by type but only by spatial location in the plant, interchange of sensors is a common defect. With sensors being used quite differently by the control system, fault-finding is difficult in practice and defects are regularly causing commissioning delays at considerable expense. Validation and handling of faults in the sensor configuration are therefore essential to cut costs during commissioning. With passive fault-diagnosis methods falling short on this problem, this paper suggests an active diagnosis procedure to isolate sensor faults at the commissioning stage, before normal operation has started. Using statistical methods, residuals are evaluated versus multiple hypothesis models in a minimization process to uniquely identify the sensor configuration. The method as such is generic and is shown in the paper to work convincingly on refrigeration systems with significant nonlinear behaviors
Original language | English |
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Title of host publication | Proceedings of the American Control Conference |
Publisher | IEEE |
Publication date | 2010 |
Pages | 3604-3610 |
ISBN (Print) | 978-1-4244-7425-7 |
Publication status | Published - 2010 |
Event | American Control Conference (ACC 2010) - Baltimore, MD, United States Duration: 3 Jun 2010 → 2 Jul 2010 http://a2c2.org/conferences/acc2010/ |
Conference
Conference | American Control Conference (ACC 2010) |
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Country/Territory | United States |
City | Baltimore, MD |
Period | 03/06/2010 → 02/07/2010 |
Internet address |