Active Sensor Configuration Validation for Refrigeration Systems

Tobias Gybel Hovgaard, Mogens Blanke, Hans Henrik Niemann, Roozbeh Izadi-Zamanabadi

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Abstract

Major faults in the commissioning phase of refrigeration systems are caused by defects related to sensors. With a number of similar sensors available that do not differ by type but only by spatial location in the plant, interchange of sensors is a common defect. With sensors being used quite differently by the control system, fault-finding is difficult in practice and defects are regularly causing commissioning delays at considerable expense. Validation and handling of faults in the sensor configuration are therefore essential to cut costs during commissioning. With passive fault-diagnosis methods falling short on this problem, this paper suggests an active diagnosis procedure to isolate sensor faults at the commissioning stage, before normal operation has started. Using statistical methods, residuals are evaluated versus multiple hypothesis models in a minimization process to uniquely identify the sensor configuration. The method as such is generic and is shown in the paper to work convincingly on refrigeration systems with significant nonlinear behaviors
Original languageEnglish
Title of host publicationProceedings of the American Control Conference
PublisherIEEE
Publication date2010
Pages3604-3610
ISBN (Print)978-1-4244-7425-7
Publication statusPublished - 2010
EventAmerican Control Conference (ACC 2010) - Baltimore, MD, United States
Duration: 3 Jun 20102 Jul 2010
http://a2c2.org/conferences/acc2010/

Conference

ConferenceAmerican Control Conference (ACC 2010)
CountryUnited States
CityBaltimore, MD
Period03/06/201002/07/2010
Internet address

Bibliographical note

Session Best Paper Award

Cite this

Hovgaard, T. G., Blanke, M., Niemann, H. H., & Izadi-Zamanabadi, R. (2010). Active Sensor Configuration Validation for Refrigeration Systems. In Proceedings of the American Control Conference (pp. 3604-3610). IEEE.