Abstract
A new method for characterization of uniaxial planar waveguides
from their measured effective mode indices is presented. The
theory is outlined and expressions for efficient computer analysis
are given. Uniaxial waveguide samples have been made in z-cut
LiNbO3 by proton exchange with and without post annealing in order
to test the method on both steplike and graded index profiles. The
resulting characterizations of the samples are discussed in
relation to the inverse WKB method. Finally, the importance of
incorporating the effects of material birefringence in the
characterization of these kind of waveguides is investigated.
Original language | English |
---|---|
Journal | Applied Optics |
Volume | 35 |
Issue number | 15 |
Pages (from-to) | 2602-2609 |
ISSN | 1559-128X |
DOIs | |
Publication status | Published - 1996 |