Accurate method for determining refractive index profiles of planar waveguides in uniaxial media with the optical axis normal to the surface.

Jesper Falden Offersgaard, Torben Veng, Torben Skettrup

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A new method for characterization of uniaxial planar waveguides from their measured effective mode indices is presented. The theory is outlined and expressions for efficient computer analysis are given. Uniaxial waveguide samples have been made in z-cut LiNbO3 by proton exchange with and without post annealing in order to test the method on both steplike and graded index profiles. The resulting characterizations of the samples are discussed in relation to the inverse WKB method. Finally, the importance of incorporating the effects of material birefringence in the characterization of these kind of waveguides is investigated.
Original languageEnglish
JournalApplied Optics
Issue number15
Pages (from-to)2602-2609
Publication statusPublished - 1996

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