Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

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Abstract

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.
Original languageEnglish
JournalAdvanced Structural and Chemical Imaging
Volume3
Issue number1
Pages (from-to)1-12
Number of pages12
ISSN2198-0926
DOIs
Publication statusPublished - 2017

Bibliographical note

This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

Keywords

  • High-resolution transmission electron microscopy
  • Strain mapping
  • Nanoparticles
  • Surface strain

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