Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Jacob Madsen; Pei Liu; Jakob Birkedal Wagner; Thomas W. Hansen; Jakob Schiøtz

doi:10.1186/s40679-017-0047-0

Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Jacob Madsen, Pei Liu, Jakob Birkedal Wagner, Thomas W. Hansen, Jakob Schiøtz

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Abstract

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.

Original language	English
Journal	Advanced Structural and Chemical Imaging
Volume	3
Issue number	1
Pages (from-to)	1-12
Number of pages	12
ISSN	2198-0926
DOIs	https://doi.org/10.1186/s40679-017-0047-0
Publication status	Published - 2017

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This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

Keywords

High-resolution transmission electron microscopy
Strain mapping
Nanoparticles
Surface strain

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abstract = "Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.",

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AU - Liu, Pei

AU - Wagner, Jakob Birkedal

AU - Hansen, Thomas W.

AU - Schiøtz, Jakob

N1 - This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

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N2 - Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.

AB - Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.

KW - High-resolution transmission electron microscopy

KW - Strain mapping

KW - Nanoparticles

KW - Surface strain

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Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

Abstract

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