Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

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Abstract

Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.
Original languageEnglish
JournalAdvanced Structural and Chemical Imaging
Volume3
Issue number1
Pages (from-to)1-12
Number of pages12
ISSN2198-0926
DOIs
Publication statusPublished - 2017

Bibliographical note

This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

Keywords

  • High-resolution transmission electron microscopy
  • Strain mapping
  • Nanoparticles
  • Surface strain

Cite this

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title = "Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles",
abstract = "Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2{\%} strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.",
keywords = "High-resolution transmission electron microscopy, Strain mapping, Nanoparticles, Surface strain",
author = "Jacob Madsen and Pei Liu and Wagner, {Jakob Birkedal} and Hansen, {Thomas W.} and Jakob Schi{\o}tz",
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Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles. / Madsen, Jacob; Liu, Pei; Wagner, Jakob Birkedal; Hansen, Thomas W.; Schiøtz, Jakob.

In: Advanced Structural and Chemical Imaging, Vol. 3, No. 1, 2017, p. 1-12.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles

AU - Madsen, Jacob

AU - Liu, Pei

AU - Wagner, Jakob Birkedal

AU - Hansen, Thomas W.

AU - Schiøtz, Jakob

N1 - This article is distributed under the terms of the Creative Commons Attribution 4.0 International License

PY - 2017

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N2 - Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.

AB - Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that absolute errors of at least 1–2% strain should be expected. The model structures include surface relaxations determined using molecular dynamics, and we show that this is important for correctly evaluating the errors introduced by image aberrations.

KW - High-resolution transmission electron microscopy

KW - Strain mapping

KW - Nanoparticles

KW - Surface strain

U2 - 10.1186/s40679-017-0047-0

DO - 10.1186/s40679-017-0047-0

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