Absorbance Measurements in the UV-range in Microsystems using Silicon Oxynitride Waveguides

Klaus Bo Mogensen, Peter Friis, Jörg Hübner, Pieter Telleman, Jörg Peter Kutter

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of Eurosensors XIV
Place of PublicationCopenhagen, Denmark
Publication date2000
Pages333-334
Publication statusPublished - 2000

Cite this

Mogensen, K. B., Friis, P., Hübner, J., Telleman, P., & Kutter, J. P. (2000). Absorbance Measurements in the UV-range in Microsystems using Silicon Oxynitride Waveguides. In Proceedings of Eurosensors XIV (pp. 333-334).