Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

Thomas Willum Hansen; Jakob Birkedal Wagner; Filippo Cavalca; Linus Daniel Leonhard Duchstein; Lionel Cervera Gontard; Rafal E. Dunin-Borkowski

Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

Thomas Willum Hansen (Invited author)
, Jakob Birkedal Wagner (Invited author)
, Filippo Cavalca (Invited author)
, Linus Daniel Leonhard Duchstein (Invited author)
, Lionel Cervera Gontard (Invited author)
, Rafal E. Dunin-Borkowski (Invited author)

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	International Microscopy Congress
Publication date	2010
Publication status	Published - 2010
Event	17th International Microscopy Congress - Rio De Janeiro, Brazil Duration: 19 Sept 2010 → 24 Sept 2010 Conference number: 17

Conference

Conference	17th International Microscopy Congress
Number	17
Country/Territory	Brazil
City	Rio De Janeiro
Period	19/09/2010 → 24/09/2010

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Cite this

@inbook{ffd8734dfba9442e9ef415cc48250484,

title = "Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges",

author = "Hansen, \{Thomas Willum\} and Wagner, \{Jakob Birkedal\} and Filippo Cavalca and Duchstein, \{Linus Daniel Leonhard\} and Gontard, \{Lionel Cervera\} and Dunin-Borkowski, \{Rafal E.\}",

year = "2010",

language = "English",

booktitle = "International Microscopy Congress",

note = "17th International Microscopy Congress, IMC17 ; Conference date: 19-09-2010 Through 24-09-2010",

}

TY - ABST

T1 - Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

AU - Hansen, Thomas Willum

AU - Wagner, Jakob Birkedal

AU - Cavalca, Filippo

AU - Duchstein, Linus Daniel Leonhard

AU - Gontard, Lionel Cervera

AU - Dunin-Borkowski, Rafal E.

N1 - Conference code: 17

PY - 2010

Y1 - 2010

M3 - Conference abstract in proceedings

BT - International Microscopy Congress

T2 - 17th International Microscopy Congress

Y2 - 19 September 2010 through 24 September 2010

ER -