Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

Thomas Willum Hansen (Invited author), Jakob Birkedal Wagner (Invited author), Filippo Cavalca (Invited author), Linus Daniel Leonhard Duchstein (Invited author), Lionel Cervera Gontard (Invited author), Rafal E. Dunin-Borkowski (Invited author)

    Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearch

    Original languageEnglish
    Title of host publicationInternational Microscopy Congress
    Publication date2010
    Publication statusPublished - 2010
    Event17th International Microscopy Congress - Rio De Janeiro, Brazil
    Duration: 19 Sep 201024 Sep 2010
    Conference number: 17

    Conference

    Conference17th International Microscopy Congress
    Number17
    CountryBrazil
    CityRio De Janeiro
    Period19/09/201024/09/2010

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