Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

Thomas Willum Hansen; Jakob Birkedal Wagner; Filippo Cavalca; Linus Daniel Leonhard Duchstein; Lionel Cervera Gontard; Rafal E. Dunin-Borkowski

Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges

Thomas Willum Hansen (Invited author), Jakob Birkedal Wagner (Invited author), Filippo Cavalca (Invited author), Linus Daniel Leonhard Duchstein (Invited author), Lionel Cervera Gontard (Invited author), Rafal E. Dunin-Borkowski (Invited author)

Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research

Original language	English
Title of host publication	International Microscopy Congress
Publication date	2010
Publication status	Published - 2010
Event	17th International Microscopy Congress - Rio De Janeiro, Brazil Duration: 19 Sept 2010 → 24 Sept 2010 Conference number: 17

Conference

Conference	17th International Microscopy Congress
Number	17
Country/Territory	Brazil
City	Rio De Janeiro
Period	19/09/2010 → 24/09/2010

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title = "Aberration Corrected Monochromated Environmental TEM Progress, Prospects and Challenges",

author = "Hansen, {Thomas Willum} and Wagner, {Jakob Birkedal} and Filippo Cavalca and Duchstein, {Linus Daniel Leonhard} and Gontard, {Lionel Cervera} and Dunin-Borkowski, {Rafal E.}",

year = "2010",

language = "English",

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note = "17th International Microscopy Congress, IMC17 ; Conference date: 19-09-2010 Through 24-09-2010",

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AU - Hansen, Thomas Willum

AU - Wagner, Jakob Birkedal

AU - Cavalca, Filippo

AU - Duchstein, Linus Daniel Leonhard

AU - Gontard, Lionel Cervera

AU - Dunin-Borkowski, Rafal E.

N1 - Conference code: 17

PY - 2010

Y1 - 2010

M3 - Conference abstract in proceedings

BT - International Microscopy Congress

T2 - 17th International Microscopy Congress

Y2 - 19 September 2010 through 24 September 2010

ER -