Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard; L-Y Chang; CJD Hetherington; AI Kirkland; D Ozkaya; Rafal E Dunin-Borkowski

doi:10.1002/anie.200604811

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard
, L-Y Chang
, CJD Hetherington
, AI Kirkland
, D Ozkaya
, Rafal E Dunin-Borkowski

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.

Original language	English
Journal	Angewandte Chemie International Edition
Volume	46
Issue number	20
Pages (from-to)	3683-3685
ISSN	1433-7851
DOIs	https://doi.org/10.1002/anie.200604811
Publication status	Published - 2007

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http://www3.interscience.wiley.com/cgi-bin/abstract/114199478/ABSTRACT?CRETRY=1&SRETRY=0

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abstract = "Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). {\textcopyright} 2007 Wiley-VCH Verlag GmbH \& Co. KGaA.",

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AU - Gontard, Lionel Cervera

AU - Chang, L-Y

AU - Hetherington, CJD

AU - Kirkland, AI

AU - Ozkaya, D

AU - Dunin-Borkowski, Rafal E

PY - 2007

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AB - Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.

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Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

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