TY - JOUR
T1 - Aberration-corrected imaging of active sites on industrial catalyst nanoparticles
AU - Gontard, Lionel Cervera
AU - Chang, L-Y
AU - Hetherington, CJD
AU - Kirkland, AI
AU - Ozkaya, D
AU - Dunin-Borkowski, Rafal E
PY - 2007
Y1 - 2007
N2 - Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.
AB - Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.
U2 - 10.1002/anie.200604811
DO - 10.1002/anie.200604811
M3 - Journal article
C2 - 17387674
SN - 1433-7851
VL - 46
SP - 3683
EP - 3685
JO - Angewandte Chemie International Edition
JF - Angewandte Chemie International Edition
IS - 20
ER -