Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

Lionel Cervera Gontard, L-Y Chang, CJD Hetherington, AI Kirkland, D Ozkaya, Rafal E Dunin-Borkowski

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co. KGaA.
    Original languageEnglish
    JournalAngewandte Chemie International Edition
    Volume46
    Issue number20
    Pages (from-to)3683-3685
    ISSN1433-7851
    DOIs
    Publication statusPublished - 2007

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