A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

Søren Fæster Nielsen; E.M. Lauridsen; D. Juul Jensen; H.F. Poulsen

doi:10.1016/S0921-5093(01)01056-5

A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

Søren Fæster Nielsen, E.M. Lauridsen, D. Juul Jensen, H.F. Poulsen

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V. All rights reserved.

Original language	English
Journal	Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing
Volume	319-321
Issue number	SI
Pages (from-to)	179-181
ISSN	0921-5093
DOIs	https://doi.org/10.1016/S0921-5093(01)01056-5
Publication status	Published - Dec 2001
Event	Meeting of the International Conference on the Strength of Materials - Asilomar (CA), United States Duration: 27 Aug 2000 → 1 Sept 2000 Conference number: 12

Conference

Conference	Meeting of the International Conference on the Strength of Materials
Number	12
Country/Territory	United States
City	Asilomar (CA)
Period	27/08/2000 → 01/09/2000

Keywords

high-energy synchrotron radiation
X-ray diffraction
deformation
in-situ measurement
three-dimensional mapping

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10.1016/S0921-5093(01)01056-5

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title = "A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals",

abstract = "The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V. All rights reserved. ",

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author = "{F{\ae}ster Nielsen}, S{\o}ren and E.M. Lauridsen and {Juul Jensen}, D. and H.F. Poulsen",

year = "2001",

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doi = "10.1016/S0921-5093(01)01056-5",

language = "English",

volume = "319-321",

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journal = "Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing",

issn = "0921-5093",

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A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals. / Fæster Nielsen, Søren; Lauridsen, E.M.; Juul Jensen, D. et al.
In: Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing, Vol. 319-321, No. SI, 12.2001, p. 179-181.

Research output: Contribution to journal › Conference article › Research › peer-review

TY - GEN

T1 - A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

AU - Fæster Nielsen, Søren

AU - Lauridsen, E.M.

AU - Juul Jensen, D.

AU - Poulsen, H.F.

N1 - Conference code: 12

PY - 2001/12

Y1 - 2001/12

N2 - The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V. All rights reserved.

AB - The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V. All rights reserved.

KW - 5-I nano

KW - high-energy synchrotron radiation

KW - X-ray diffraction

KW - deformation

KW - in-situ measurement

KW - three-dimensional mapping

U2 - 10.1016/S0921-5093(01)01056-5

DO - 10.1016/S0921-5093(01)01056-5

M3 - Conference article

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VL - 319-321

SP - 179

EP - 181

JO - Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing

JF - Materials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing

IS - SI

T2 - Meeting of the International Conference on the Strength of Materials

Y2 - 27 August 2000 through 1 September 2000

ER -

A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

Abstract

Conference

Keywords

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