A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

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    Abstract

    The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V. All rights reserved.
    Original languageEnglish
    JournalMaterials Science and Engineering: A - Structural Materials: Properties, Microstructure and Processing
    Volume319-321
    Issue numberSI
    Pages (from-to)179-181
    ISSN0921-5093
    DOIs
    Publication statusPublished - Dec 2001
    EventMeeting of the International Conference on the Strength of Materials - Asilomar (CA), United States
    Duration: 27 Aug 20001 Sep 2000
    Conference number: 12

    Conference

    ConferenceMeeting of the International Conference on the Strength of Materials
    Number12
    CountryUnited States
    CityAsilomar (CA)
    Period27/08/200001/09/2000

    Keywords

    • high-energy synchrotron radiation
    • X-ray diffraction
    • deformation
    • in-situ measurement
    • three-dimensional mapping

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