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A technique for positioning nanoparticles using an atomic force microscope

  • L. Theil Hansen
  • , Anders Kyhle
  • , Alexis Hammer Sørensen
  • , Jakob Bohr
  • , P.E. Lindelof

Research output: Contribution to journalJournal articleResearchpeer-review

Original languageEnglish
JournalNanotechnology
Volume9
Issue number4
Pages (from-to)337-342
ISSN0957-4484
Publication statusPublished - 1998

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