A substrate and a method of using it

Anil Haraksingh Thilsted; Michael Stenbæk Schmidt; Tomas Rindzevicius; Anja Boisen

A substrate and a method of using it

Anil Haraksingh Thilsted (Inventor), Michael Stenbæk Schmidt (Inventor), Tomas Rindzevicius (Inventor), Anja Boisen (Inventor)

Research output: Patent

167 Downloads (Pure)

Abstract

A substrate for a plurality of different measurement set-ups such as SERS, SPR and LSPR which substrate has a base and a plurality of elongate elements with metallic tips. A metallic layer is present on the base surface between the elongate elements and gaps or cavities exist between the layer and the tips or elongate elements. When the elongate elements and the base are transparent, transmission measurement set-ups are also possible.

Original language	English
IPC	G01N 21/ 65 A I
Patent number	EP3076161
Filing date	05/10/2016
Country/Territory	International Bureau of the World Intellectual Property Organization (WIPO)
Priority date	01/04/2015
Priority number	EP20150162286
Publication status	Published - 5 Oct 2016

Access to Document

EP3076161A1Final published version, 1.02 MB

OpenUrl availability

Full text

Cite this

@misc{93dad288a12142f5b199e18ba30f2ec9,

title = "A substrate and a method of using it",

abstract = "A substrate for a plurality of different measurement set-ups such as SERS, SPR and LSPR which substrate has a base and a plurality of elongate elements with metallic tips. A metallic layer is present on the base surface between the elongate elements and gaps or cavities exist between the layer and the tips or elongate elements. When the elongate elements and the base are transparent, transmission measurement set-ups are also possible.",

author = "Thilsted, {Anil Haraksingh} and Schmidt, {Michael Stenb{\ae}k} and Tomas Rindzevicius and Anja Boisen",

year = "2016",

month = oct,

day = "5",

language = "English",

type = "Patent",

note = "EP3076161; G01N 21/ 65 A I",

}

TY - PAT

T1 - A substrate and a method of using it

AU - Thilsted, Anil Haraksingh

AU - Schmidt, Michael Stenbæk

AU - Rindzevicius, Tomas

AU - Boisen, Anja

PY - 2016/10/5

Y1 - 2016/10/5

N2 - A substrate for a plurality of different measurement set-ups such as SERS, SPR and LSPR which substrate has a base and a plurality of elongate elements with metallic tips. A metallic layer is present on the base surface between the elongate elements and gaps or cavities exist between the layer and the tips or elongate elements. When the elongate elements and the base are transparent, transmission measurement set-ups are also possible.

AB - A substrate for a plurality of different measurement set-ups such as SERS, SPR and LSPR which substrate has a base and a plurality of elongate elements with metallic tips. A metallic layer is present on the base surface between the elongate elements and gaps or cavities exist between the layer and the tips or elongate elements. When the elongate elements and the base are transparent, transmission measurement set-ups are also possible.

M3 - Patent

M1 - EP3076161

Y2 - 2016/10/05

ER -

A substrate and a method of using it

Abstract

Access to Document

OpenUrl availability

Fingerprint

Cite this