A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy
Malte Behrens, Jan Tomforde, Enno May, Wolff-Ragnar Kiebach, Wolfgang Bensch, Dietrich Häußler, Wolfgang Jäger
Research output: Contribution to journal › Journal article › Research › peer-review
Fingerprint
Dive into the research topics of 'A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy'. Together they form a unique fingerprint.