A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

Malte Behrens, Jan Tomforde, Enno May, Wolff-Ragnar Kiebach, Wolfgang Bensch, Dietrich Häußler, Wolfgang Jäger

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Chemical Compounds

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