A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

Malte Behrens, Jan Tomforde, Enno May, Wolff-Ragnar Kiebach, Wolfgang Bensch, Dietrich Häußler, Wolfgang Jäger

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300°C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20°C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe3 nucleating at 230°C. In ternary samples (Se:Te=0.6–1.2), the low-temperature nucleation of such a layered CrQ3 (Q=Se, Te) phase is suppressed and instead the phase Cr2Q3 nucleates first. Interestingly, this phase decomposes around 500°C into layered CrQ3. In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr3Se4 nucleates around 500°C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se–Cr distances of 2.568(1) and 2.552(1)Å for Cr2Q3 and CrQ3, respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se–Te contacts in the structure.
Original languageEnglish
JournalJournal of Solid State Chemistry
Volume179
Issue number11
Pages (from-to)3330-3337
ISSN0022-4596
DOIs
Publication statusPublished - 2006
Externally publishedYes

Cite this

Behrens, Malte ; Tomforde, Jan ; May, Enno ; Kiebach, Wolff-Ragnar ; Bensch, Wolfgang ; Häußler, Dietrich ; Jäger, Wolfgang. / A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy. In: Journal of Solid State Chemistry. 2006 ; Vol. 179, No. 11. pp. 3330-3337.
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title = "A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy",
abstract = "The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300°C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20°C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe3 nucleating at 230°C. In ternary samples (Se:Te=0.6–1.2), the low-temperature nucleation of such a layered CrQ3 (Q=Se, Te) phase is suppressed and instead the phase Cr2Q3 nucleates first. Interestingly, this phase decomposes around 500°C into layered CrQ3. In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr3Se4 nucleates around 500°C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se–Cr distances of 2.568(1) and 2.552(1){\AA} for Cr2Q3 and CrQ3, respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se–Te contacts in the structure.",
author = "Malte Behrens and Jan Tomforde and Enno May and Wolff-Ragnar Kiebach and Wolfgang Bensch and Dietrich H{\"a}u{\ss}ler and Wolfgang J{\"a}ger",
year = "2006",
doi = "10.1016/j.jssc.2006.06.024",
language = "English",
volume = "179",
pages = "3330--3337",
journal = "Journal of Solid State Chemistry",
issn = "0022-4596",
publisher = "Academic Press",
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}

A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy. / Behrens, Malte; Tomforde, Jan; May, Enno; Kiebach, Wolff-Ragnar; Bensch, Wolfgang; Häußler, Dietrich; Jäger, Wolfgang.

In: Journal of Solid State Chemistry, Vol. 179, No. 11, 2006, p. 3330-3337.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy

AU - Behrens, Malte

AU - Tomforde, Jan

AU - May, Enno

AU - Kiebach, Wolff-Ragnar

AU - Bensch, Wolfgang

AU - Häußler, Dietrich

AU - Jäger, Wolfgang

PY - 2006

Y1 - 2006

N2 - The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300°C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20°C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe3 nucleating at 230°C. In ternary samples (Se:Te=0.6–1.2), the low-temperature nucleation of such a layered CrQ3 (Q=Se, Te) phase is suppressed and instead the phase Cr2Q3 nucleates first. Interestingly, this phase decomposes around 500°C into layered CrQ3. In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr3Se4 nucleates around 500°C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se–Cr distances of 2.568(1) and 2.552(1)Å for Cr2Q3 and CrQ3, respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se–Te contacts in the structure.

AB - The reactivity of [Cr/Se/Te] multilayers under annealing was investigated using X-ray reflectometry, in situ X-ray diffraction, X-ray absorption fine structure (XAFS) measurements and transmission electron microscopy. For all samples, interdiffusion was complete at temperatures between 100 and 300°C, depending on the repeating tri-layer thickness. A crystalline phase nucleated approximately 20°C above the temperature where interdiffusion was finished. The first crystalline phase in a binary Cr/Te sample was layered CrTe3 nucleating at 230°C. In ternary samples (Se:Te=0.6–1.2), the low-temperature nucleation of such a layered CrQ3 (Q=Se, Te) phase is suppressed and instead the phase Cr2Q3 nucleates first. Interestingly, this phase decomposes around 500°C into layered CrQ3. In contrast, binary Cr/Se samples form stable amorphous alloys after interdiffusion and Cr3Se4 nucleates around 500°C as the only crystalline phase. Evaluation of the XAFS data of annealed samples yield Se–Cr distances of 2.568(1) and 2.552(1)Å for Cr2Q3 and CrQ3, respectively. In the latter sample, higher coordination shells around Se are seen accounting for the Se–Te contacts in the structure.

U2 - 10.1016/j.jssc.2006.06.024

DO - 10.1016/j.jssc.2006.06.024

M3 - Journal article

VL - 179

SP - 3330

EP - 3337

JO - Journal of Solid State Chemistry

JF - Journal of Solid State Chemistry

SN - 0022-4596

IS - 11

ER -