A simple algorithm for measuring particle size distributions on an uneven background from TEM images

Lionel Cervera Gontard, Dogan Ozkaya, Rafal E. Dunin-Borkowski

    Research output: Contribution to journalJournal articlepeer-review

    Abstract

    Nanoparticles have a wide range of applications in science and technology. Their sizes are often measured using transmission electron microscopy (TEM) or X-ray diffraction. Here, we describe a simple computer algorithm for measuring particle size distributions from TEM images in the presence of an uneven background. The approach is based on adaptive thresholding, making use of local threshold values that change with spatial coordinate. The algorithm allows particles to be detected and characterized with greater accuracy than using more conventional methods, in which a global threshold is used. Its application to images of heterogeneous catalysts is presented.
    Original languageEnglish
    JournalUltramicroscopy
    Volume111
    Issue number2
    Pages (from-to)101-106
    ISSN0304-3991
    DOIs
    Publication statusPublished - 2011

    Keywords

    • TEM
    • Particle sizedistribution
    • Image processing

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