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A processing method of the probe characteristic in a two electron temperature plasma

D. Ruscanu, G. Popa, Eugen Stamate

Research output: Chapter in Book/Report/Conference proceedingConference abstract in proceedingsResearchpeer-review

Abstract

The electron distribution function (EDF) has to be known in order to understand or/and to explain the phenomena which depend on velocities of the electrons. Experimentally the EDF could be measured either using an electrostatic analyzer (EA) or a Langmuir probe. In the former case the EDF is proportional with the first derivative of the current-voltage characteristic of the collector, while in the latter the second derivative of the probe characteristic gives the EDF in the case that it is isotropic. Besides there are methods based on the assumption that the real EDF could be approximated by a convolution of two maxwellian distribution functions, so that the model of two electron temperature plasma is quite frequently used. The temperatures and densities of these two groups of electrons are measured by Langmuir probe and using either the method of semilogarithmic curve or a numerical method based on the best fit. In this paper we present a new method for processing of the probe characteristic based on the common Langmuir assumptions and in addition the supposition that the electron current of the Langmuir plane probe is a sum of two electron currents which correspond to two groups of electrons each of each with a Maxwellian EDF.
Original languageEnglish
Title of host publicationProceedings of International Conference on Plasma Physics (ICCP)
Number of pages5
Volume2
Place of PublicationSwitzerland
Publication date1992
Pages1179-1183
Publication statusPublished - 1992
Externally publishedYes
Event1992 International Conference on Plasma Physics - Innsbruck, Austria
Duration: 29 Jun 19923 Jul 1992

Conference

Conference1992 International Conference on Plasma Physics
Country/TerritoryAustria
CityInnsbruck
Period29/06/199203/07/1992
SeriesEurophysics Conference Abstracts
Volume16C
ISSN0378-2271

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