A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Harsh Rajesh Parikh, Sergiu Viorel Spataru, Dezso Séra, Claire Mantel, Gisele A. dos Reis Benatto, Peter Poulsen, Kenn H. B. Frederiksen, Søren Forchhammer, Jan Vedde

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Abstract

Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.
Original languageEnglish
Title of host publicationProceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)
Number of pages6
PublisherIEEE
Publication date2020
ISBN (Electronic)978-1-7281-0494-2
DOIs
Publication statusPublished - 2020
Event46th IEEE Photovoltaic Specialists Conference - Chicago, United States
Duration: 16 Jun 201921 Jun 2019
Conference number: 46

Conference

Conference46th IEEE Photovoltaic Specialists Conference
Number46
CountryUnited States
CityChicago
Period16/06/201921/06/2019

Keywords

  • EL imaging
  • Lock-in technique
  • Ambient noise level
  • Perspective distortion
  • Lock-in measurement procedure
  • System delays

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