A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Harsh Rajesh Parikh; Sergiu Viorel Spataru; Dezso Séra; Claire Mantel; Gisele A. dos Reis Benatto; Peter Poulsen; Kenn H. B. Frederiksen; Søren Forchhammer; Jan Vedde

doi:10.1109/PVSC40753.2019.8981255

A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Harsh Rajesh Parikh, Sergiu Viorel Spataru, Dezso Séra, Claire Mantel, Gisele A. dos Reis Benatto, Peter Poulsen, Kenn H. B. Frederiksen, Søren Forchhammer, Jan Vedde

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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Abstract

Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.

Original language	English
Title of host publication	Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)
Number of pages	6
Publisher	IEEE
Publication date	2020
ISBN (Electronic)	978-1-7281-0494-2
DOIs	https://doi.org/10.1109/PVSC40753.2019.8981255
Publication status	Published - 2020
Event	46th IEEE Photovoltaic Specialists Conference - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 Conference number: 46

Conference

Conference	46th IEEE Photovoltaic Specialists Conference
Number	46
Country	United States
City	Chicago
Period	16/06/2019 → 21/06/2019

Keywords

EL imaging
Lock-in technique
Ambient noise level
Perspective distortion
Lock-in measurement procedure
System delays

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Poulsen, P. B., Thorsteinsson, S., Forchhammer, S., Benatto, G. A. D. R., Riedel-Lyngskær, N. C., Thorseth, A., Dam-Hansen, C. & Mantel, C.
01/01/2017 → 31/12/2019
Project: Research

Cite this

@inproceedings{06c8c9483f3344abaa9a1424a2086616,

title = "A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging",

abstract = "Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.",

keywords = "EL imaging, Lock-in technique, Ambient noise level, Perspective distortion, Lock-in measurement procedure, System delays",

author = "Parikh, {Harsh Rajesh} and Spataru, {Sergiu Viorel} and Dezso S{\'e}ra and Claire Mantel and {A. dos Reis Benatto}, Gisele and Peter Poulsen and Frederiksen, {Kenn H. B.} and S{\o}ren Forchhammer and Jan Vedde",

year = "2020",

doi = "10.1109/PVSC40753.2019.8981255",

language = "English",

booktitle = "Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)",

publisher = "IEEE",

address = "United States",

note = "46th IEEE Photovoltaic Specialists Conference, PVSC46 ; Conference date: 16-06-2019 Through 21-06-2019",

}

Parikh, HR, Spataru, SV, Séra, D, Mantel, C , A. dos Reis Benatto, G , Poulsen, P, Frederiksen, KHB, Forchhammer, S & Vedde, J 2020, A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. in Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 46th IEEE Photovoltaic Specialists Conference, Chicago, United States, 16/06/2019. https://doi.org/10.1109/PVSC40753.2019.8981255

A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. / Parikh, Harsh Rajesh; Spataru, Sergiu Viorel; Séra, Dezso; Mantel, Claire ; A. dos Reis Benatto, Gisele ; Poulsen, Peter; Frederiksen, Kenn H. B.; Forchhammer, Søren; Vedde, Jan.

Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 2020.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

TY - GEN

T1 - A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

AU - Parikh, Harsh Rajesh

AU - Spataru, Sergiu Viorel

AU - Séra, Dezso

AU - Mantel, Claire

AU - A. dos Reis Benatto, Gisele

AU - Poulsen, Peter

AU - Frederiksen, Kenn H. B.

AU - Forchhammer, Søren

AU - Vedde, Jan

N1 - Conference code: 46

PY - 2020

Y1 - 2020

N2 - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.

AB - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.

KW - EL imaging

KW - Lock-in technique

KW - Ambient noise level

KW - Perspective distortion

KW - Lock-in measurement procedure

KW - System delays

U2 - 10.1109/PVSC40753.2019.8981255

DO - 10.1109/PVSC40753.2019.8981255

M3 - Article in proceedings

BT - Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)

PB - IEEE

T2 - 46th IEEE Photovoltaic Specialists Conference

Y2 - 16 June 2019 through 21 June 2019

ER -

A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Abstract

Conference

Keywords

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