A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Harsh Rajesh Parikh, Sergiu Viorel Spataru, Dezso Séra, Claire Mantel, Gisele A. dos Reis Benatto, Peter Poulsen, Kenn H. B. Frederiksen, Søren Forchhammer, Jan Vedde

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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Abstract

Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.
Original languageEnglish
Title of host publicationProceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)
Number of pages6
PublisherIEEE
Publication statusAccepted/In press - 2019
Event46th IEEE Photovoltaic Specialists Conference - Chicago, United States
Duration: 16 Jun 201921 Jun 2019
Conference number: 46

Conference

Conference46th IEEE Photovoltaic Specialists Conference
Number46
CountryUnited States
CityChicago
Period16/06/201921/06/2019

Keywords

  • EL imaging
  • Lock-in technique
  • Ambient noise level
  • Perspective distortion
  • Lock-in measurement procedure
  • System delays

Cite this

Parikh, H. R., Spataru, S. V., Séra, D., Mantel, C., A. dos Reis Benatto, G., Poulsen, P., ... Vedde, J. (Accepted/In press). A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. In Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46) IEEE.
Parikh, Harsh Rajesh ; Spataru, Sergiu Viorel ; Séra, Dezso ; Mantel, Claire ; A. dos Reis Benatto, Gisele ; Poulsen, Peter ; Frederiksen, Kenn H. B. ; Forchhammer, Søren ; Vedde, Jan. / A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 2019.
@inproceedings{06c8c9483f3344abaa9a1424a2086616,
title = "A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging",
abstract = "Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.",
keywords = "EL imaging, Lock-in technique, Ambient noise level, Perspective distortion, Lock-in measurement procedure, System delays",
author = "Parikh, {Harsh Rajesh} and Spataru, {Sergiu Viorel} and Dezso S{\'e}ra and Claire Mantel and {A. dos Reis Benatto}, Gisele and Peter Poulsen and Frederiksen, {Kenn H. B.} and S{\o}ren Forchhammer and Jan Vedde",
year = "2019",
language = "English",
booktitle = "Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)",
publisher = "IEEE",
address = "United States",

}

Parikh, HR, Spataru, SV, Séra, D, Mantel, C, A. dos Reis Benatto, G, Poulsen, P, Frederiksen, KHB, Forchhammer, S & Vedde, J 2019, A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. in Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 46th IEEE Photovoltaic Specialists Conference, Chicago, United States, 16/06/2019.

A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. / Parikh, Harsh Rajesh; Spataru, Sergiu Viorel; Séra, Dezso; Mantel, Claire; A. dos Reis Benatto, Gisele; Poulsen, Peter; Frederiksen, Kenn H. B.; Forchhammer, Søren; Vedde, Jan.

Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 2019.

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

TY - GEN

T1 - A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

AU - Parikh, Harsh Rajesh

AU - Spataru, Sergiu Viorel

AU - Séra, Dezso

AU - Mantel, Claire

AU - A. dos Reis Benatto, Gisele

AU - Poulsen, Peter

AU - Frederiksen, Kenn H. B.

AU - Forchhammer, Søren

AU - Vedde, Jan

PY - 2019

Y1 - 2019

N2 - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.

AB - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.

KW - EL imaging

KW - Lock-in technique

KW - Ambient noise level

KW - Perspective distortion

KW - Lock-in measurement procedure

KW - System delays

M3 - Article in proceedings

BT - Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)

PB - IEEE

ER -

Parikh HR, Spataru SV, Séra D, Mantel C, A. dos Reis Benatto G, Poulsen P et al. A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. In Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE. 2019