A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging

Harsh Rajesh Parikh, Sergiu Viorel Spataru, Dezso Séra, Claire Mantel, Gisele A. dos Reis Benatto, Peter Poulsen, Kenn H. B. Frederiksen, Søren Forchhammer, Jan Vedde

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    Abstract

    Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.
    Original languageEnglish
    Title of host publicationProceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)
    Number of pages6
    PublisherIEEE
    Publication date2020
    ISBN (Electronic)978-1-7281-0494-2
    DOIs
    Publication statusPublished - 2020
    Event2019 IEEE 46th Photovoltaic Specialists Conference - Chicago, United States
    Duration: 16 Jun 201921 Jun 2019
    Conference number: 46
    https://ieeexplore.ieee.org/xpl/conhome/8963747/proceeding

    Conference

    Conference2019 IEEE 46th Photovoltaic Specialists Conference
    Number46
    Country/TerritoryUnited States
    CityChicago
    Period16/06/201921/06/2019
    Internet address

    Keywords

    • EL imaging
    • Lock-in technique
    • Ambient noise level
    • Perspective distortion
    • Lock-in measurement procedure
    • System delays

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