Abstract
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46) |
| Number of pages | 6 |
| Publisher | IEEE |
| Publication status | Accepted/In press - 2019 |
| Event | 46th IEEE Photovoltaic Specialists Conference - Chicago, United States Duration: 16 Jun 2019 → 21 Jun 2019 Conference number: 46 |
Conference
| Conference | 46th IEEE Photovoltaic Specialists Conference |
|---|---|
| Number | 46 |
| Country | United States |
| City | Chicago |
| Period | 16/06/2019 → 21/06/2019 |
Keywords
- EL imaging
- Lock-in technique
- Ambient noise level
- Perspective distortion
- Lock-in measurement procedure
- System delays
Cite this
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A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging. / Parikh, Harsh Rajesh; Spataru, Sergiu Viorel; Séra, Dezso; Mantel, Claire; A. dos Reis Benatto, Gisele; Poulsen, Peter; Frederiksen, Kenn H. B.; Forchhammer, Søren; Vedde, Jan.
Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46). IEEE, 2019.Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
TY - GEN
T1 - A Photovoltaic Module Diagnostic Setup for Lock-IN Electroluminescence Imaging
AU - Parikh, Harsh Rajesh
AU - Spataru, Sergiu Viorel
AU - Séra, Dezso
AU - Mantel, Claire
AU - A. dos Reis Benatto, Gisele
AU - Poulsen, Peter
AU - Frederiksen, Kenn H. B.
AU - Forchhammer, Søren
AU - Vedde, Jan
PY - 2019
Y1 - 2019
N2 - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.
AB - Electroluminescence (EL) imaging and infrared (IRT) thermography techniques have become indispensable tools in recent years for health diagnostic of PV modules in solar industry application. We propose a diagnostic setup which performs lock-in EL for accurate analysis of different types of faults occurring in a solar module. The setup is built around a high-speed SWIR camera, which can acquire images at very short integration time (1 µs), and high frame rate (301 fps). In addition, a state-of-the-art imaging chamber allows for introducing controlled levels of ambient light noise, rotation of panel frame in xyz direction for developing new light noise removal techniques. The purpose of the diagnostic setup is to support research in PV failure quantification through EL imaging which can also be useful for aerial drone imaging of PV plants.
KW - EL imaging
KW - Lock-in technique
KW - Ambient noise level
KW - Perspective distortion
KW - Lock-in measurement procedure
KW - System delays
M3 - Article in proceedings
BT - Proceedings of 46th Ieee Photovoltaic Specialists Conference (pvsc 46)
PB - IEEE
ER -