Skip to main navigation Skip to search Skip to main content

A Novel Method for HBT Intrinsic Collector Resistance Extraction from S-parameters

  • Tom Keinicke Johansen
  • , Viktor Krozer
  • , Dzenan Hadziabdic
  • , Chenhui Jiang
  • , Agnieszka Konczykowska
  • , Jean-Yves Dupuy

    Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

    898 Downloads (Orbit)

    Abstract

    In this paper the extraction of series resistances for high-speed InP DHBT devices is investigated. Known extraction methods based on measured S-parameters are reviewed and error terms are identified. A novel method for intrinsic collector resistance extraction is proposed. The method is based on S- parameters measured in saturation and forward active regions. The results are applied to the large-signal modeling of InP DHBT devices using the UCSD HBT model and very accurate model response is obtained.
    Original languageEnglish
    Title of host publicationAsia-Pacific Microwave Conference, 2007. APMC 2007.
    Volume1-5
    PublisherIEEE
    Publication date2007
    Pages1927-1930
    ISBN (Print)978-1-4244-0748-4
    DOIs
    Publication statusPublished - 2007
    EventAsia Pacific Microwave Conference 2007 - Bangkok, Thailand
    Duration: 11 Dec 200714 Dec 2007

    Conference

    ConferenceAsia Pacific Microwave Conference 2007
    Country/TerritoryThailand
    CityBangkok
    Period11/12/200714/12/2007

    Bibliographical note

    Copyright: 2007 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE

    Fingerprint

    Dive into the research topics of 'A Novel Method for HBT Intrinsic Collector Resistance Extraction from S-parameters'. Together they form a unique fingerprint.

    Cite this