A Novel Detection and Localization Approach of Open-Circuit Switch Fault for the Grid-Connected Modular Multilevel Converter

Yu Jin, Qian Xiao, Hongjie Jia, Yanchao Ji, Tomislav Dragicevic, Remus Teodorescu, Frede Blaabjerg

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Abstract

The open-circuit fault detection and localization (FDL) technique can improve the reliability of the modular multilevel converter (MMC). However, the conventional software-based FDL methods usually have a heavy computation burden or a limited localization speed. This paper proposes a simplified and fast software-based FDL approach for the grid-connected MMC. Firstly, the errors between the measured state variables (the output current and the circulating current) and their estimated values are calculated. By comparing these errors with their threshold values, the switch fault can not only be detected, but also be localized to the specific arm. Then, the capacitor voltages in this faulty arm are collected, and the submodule (SM) with the highest capacitor voltage is selected. To confirm the switch fault in this SM, a modified Pauta criterion is presented to check the abnormal voltage data. As a result, the computation burden of the proposed software-based FDL approach is significantly reduced, and the faulty SM can be localized in a short period. Simulation and experimental results verify that the proposed approach can effectively detect and locate different open-circuit faults, and it is immune to the step of power references.
Original languageEnglish
JournalIEEE Transactions on Industrial Electronics
VolumePP
Issue number99
Number of pages11
ISSN0278-0046
DOIs
Publication statusAccepted/In press - 2022

Keywords

  • Modular multilevel converter
  • Fault detection
  • Fault localization
  • Open-circuit fault in IGBT
  • Switch fault

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