A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions

Jesper Holm, Jesper Mygind

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Abstract

A novel cryogenic scanning laser microscope with a spatial resolution of less than 5 µm has been designed for on-chip in situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit to a very localized heating induced by irradiation with 675 nm wavelength light from a semiconductor laser. The hot spot is moved by a specially designed piezoelectric scanner sweeping the tip of a single-mode optical fiber a few µm above the circuit. Depending on the scanner design the scanning area can be as large as 50×500 µm2 at 4.2 K. The microscope can be operated in the temperature range 2–300 K using a standard temperature controller. The central microscope body is mounted inside the vacuum can of a dip-stick-type cryoprobe. A damped spring system is used to reduce interference from extraneous mechanical vibrations. The microscope is integrated in a personal-computer-based data acquisition and control setup. ©1995 American Institute of Physics.
Original languageEnglish
JournalReview of Scientific Instruments
Volume66
Issue number9
Pages (from-to)4547-4551
ISSN0034-6748
DOIs
Publication statusPublished - 1995

Bibliographical note

Copyright (1995) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

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