A new way of estimating compute-boundedness and its application to dynamic voltage scaling

Vasanth Venkatachalam, Michael Franz, Christian W. Probst

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    Many dynamic voltage scaling algorithms rely on measuring hardware events (such as cache misses) for predicting how much a workload can be slowed down with acceptable performance loss. The events measured, however, are at best indirectly related to execution time and clock frequency. By relating these two indicators logically, we propose a new way of predicting a workload's compute-boundedness that is based on direct observation, and only requires measuring the total execution cycles for the two highest clock frequencies. Our predictor can be used to develop dynamic voltage scaling algorithms that are more system-aware than current approaches.
    Original languageEnglish
    JournalInternational Journal of Embedded Systems
    Volume3
    Issue number1-2
    Pages (from-to)17-30
    ISSN1741-1068
    DOIs
    Publication statusPublished - 2007

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