TY - JOUR
T1 - A new way of estimating compute-boundedness and its application to dynamic voltage scaling
AU - Venkatachalam, Vasanth
AU - Franz, Michael
AU - Probst, Christian W.
PY - 2007
Y1 - 2007
N2 - Many dynamic voltage scaling algorithms rely on measuring hardware events (such as cache misses) for predicting how much a workload can be slowed down with acceptable performance loss. The events measured, however, are at best indirectly related to execution time and clock frequency. By relating these two indicators logically, we propose a new way of predicting a workload's compute-boundedness that is based on direct observation, and only requires measuring the total execution cycles for the two highest clock frequencies. Our predictor can be used to develop dynamic voltage scaling algorithms that are more system-aware than current approaches.
AB - Many dynamic voltage scaling algorithms rely on measuring hardware events (such as cache misses) for predicting how much a workload can be slowed down with acceptable performance loss. The events measured, however, are at best indirectly related to execution time and clock frequency. By relating these two indicators logically, we propose a new way of predicting a workload's compute-boundedness that is based on direct observation, and only requires measuring the total execution cycles for the two highest clock frequencies. Our predictor can be used to develop dynamic voltage scaling algorithms that are more system-aware than current approaches.
U2 - 10.1504/IJES.2007.016030
DO - 10.1504/IJES.2007.016030
M3 - Journal article
SN - 1741-1068
VL - 3
SP - 17
EP - 30
JO - International Journal of Embedded Systems
JF - International Journal of Embedded Systems
IS - 1-2
ER -