A new principle of orientation determination for 3D electron diffraction microscopy

Haihua Liu; Henning Friis Poulsen; Søren Schmidt; Henning Osholm Sørensen; A. Godfrey; Xiaoxu Huang

A new principle of orientation determination for 3D electron diffraction microscopy

Haihua Liu, Henning Friis Poulsen, Søren Schmidt, Henning Osholm Sørensen, A. Godfrey, Xiaoxu Huang

Tsinghua University

Research output: Contribution to journal › Conference article › Research › peer-review

Original language	English
Journal	Proceedings of the Risø International Symposium on Materials Science
Volume	31
Pages (from-to)	311-316
ISSN	0907-0079
Publication status	Published - 2010
Event	31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques - Risø DTU, Roskilde, Denmark Duration: 6 Sept 2010 → 10 Sept 2010

Conference

Conference	31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques
Location	Risø DTU
Country/Territory	Denmark
City	Roskilde
Period	06/09/2010 → 10/09/2010

Keywords

Materials characterization and modelling
Materials and energy storage

OpenUrl availability

Full text

Cite this

@inproceedings{9ffd7e41ffb64ba694cfa23cf3fcbddc,

title = "A new principle of orientation determination for 3D electron diffraction microscopy",

keywords = "Materials characterization and modelling, Materials and energy storage, Materialekarakterisering og materialemodellering, Materialer og energilagring",

author = "Haihua Liu and Poulsen, {Henning Friis} and S{\o}ren Schmidt and S{\o}rensen, {Henning Osholm} and A. Godfrey and Xiaoxu Huang",

year = "2010",

language = "English",

volume = "31",

pages = "311--316",

journal = "Proceedings of the Ris{\o} International Symposium on Materials Science",

issn = "0907-0079",

publisher = "Ris{\o} National Laboratory",

note = "31st Ris{\o} International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques ; Conference date: 06-09-2010 Through 10-09-2010",

}

TY - GEN

T1 - A new principle of orientation determination for 3D electron diffraction microscopy

AU - Liu, Haihua

AU - Poulsen, Henning Friis

AU - Schmidt, Søren

AU - Sørensen, Henning Osholm

AU - Godfrey, A.

AU - Huang, Xiaoxu

PY - 2010

Y1 - 2010

KW - Materials characterization and modelling

KW - Materials and energy storage

KW - Materialekarakterisering og materialemodellering

KW - Materialer og energilagring

M3 - Conference article

SN - 0907-0079

VL - 31

SP - 311

EP - 316

JO - Proceedings of the Risø International Symposium on Materials Science

JF - Proceedings of the Risø International Symposium on Materials Science

T2 - 31st Risø International Symposium on Materials Science : Challenges in materials science and possibilities in 3D and 4D characterization techniques

Y2 - 6 September 2010 through 10 September 2010

ER -