A new method to detect geometrical information by the tunneling microscope

S. Tasaki, J. Levitan, Jesper Mygind

Research output: Contribution to journalJournal articleResearchpeer-review

205 Downloads (Pure)

Abstract

A new method for the detection of the geometrical information by the scanning tunneling microscope is proposed. In addition to the bias voltage, a small ac modulation is applied. The nonlinear dependence of the transmission coefficient on the applied voltage is used to generate harmonics. The ratio of the harmonics to the dc current is found to give the width between the sample and the probe, i.e., the geometrical information. This method may be useful to measure materials, where the local-spatial-density of states may change notably from place to place. ©1997 American Institute of Physics.
Original languageEnglish
JournalJournal of Applied Physics
Volume82
Issue number9
Pages (from-to)4148-4152
ISSN0021-8979
DOIs
Publication statusPublished - 1997

Bibliographical note

Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Fingerprint

Dive into the research topics of 'A new method to detect geometrical information by the tunneling microscope'. Together they form a unique fingerprint.

Cite this