A new generic method to extract stoichiometric and dynamic information from the exit-wave for thin sample

Dirk Van Dyck, Fu-Rong Home, Christian Kisielowski, Stig Helveg

Research output: Contribution to journalConference abstract in journalResearchpeer-review

Original languageEnglish
JournalMicroscopy and Microanalysis
Volume27
Issue numbersuppl.1
Pages (from-to)2314-2316
ISSN1431-9276
DOIs
Publication statusPublished - 2021

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