A Monte Carlo simulation of scattering reduction in spectral x-ray computed tomography

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In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples. An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g. X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100). We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).
Original languageEnglish
Title of host publicationAdvances in Computational Methods for X-Ray Optics IV
EditorsOleg Chubar, Kawal Sawhney
Number of pages9
Volume10388
PublisherSPIE - International Society for Optical Engineering
Publication date2017
Article number103880P
DOIs
Publication statusPublished - 2017
EventSPIE Optics + Photonics 2017 - San Diego, United States
Duration: 6 Aug 201710 Aug 2017
http://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/optics-and-photonics-2017

Conference

ConferenceSPIE Optics + Photonics 2017
CountryUnited States
CitySan Diego
Period06/08/201710/08/2017
Internet address
SeriesProceedings of S P I E - International Society for Optical Engineering
ISSN0277-786X
CitationsWeb of Science® Times Cited: No match on DOI

    Research areas

  • Computed tomography , Spectral CT, X-ray scattering, MOnte Carlo simulations, Scattered radiation, Fan beam CT
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