Abstract
In X-ray computed tomography (CT), scattered radiation plays an important role in the accurate reconstruction of the inspected object, leading to a loss of contrast between the different materials in the reconstruction volume and cupping artifacts in the images. We present a Monte Carlo simulation tool for spectral X-ray CT to predict the scattered radiation generated by complex samples. An experimental setup is presented to isolate the energy distribution of scattered radiation. Spectral CT is a novel technique implementing photon-counting detectors able to discriminate the energy of incoming photons, enabling spectral analysis of X-ray images. This technique is useful to extract efficiently more information on energy dependent quantities (e.g. mass attenuations coefficients) and study matter interactions (e.g. X-ray scattering, photoelectric absorption, etc...). Having a good knowledge of the spectral distribution of the scattered X-rays is fundamental to establish methods attempting to correct for it. The simulations are validated by real measurements using a CdTe spectral resolving detector (Multix ME-100). We observed the effect of the scattered radiation on the image reconstruction, becoming relevant in the energy range where the Compton events are dominant (i.e. above 50keV).
| Original language | English |
|---|---|
| Title of host publication | Advances in Computational Methods for X-Ray Optics IV |
| Editors | Oleg Chubar, Kawal Sawhney |
| Number of pages | 9 |
| Volume | 10388 |
| Publisher | SPIE - International Society for Optical Engineering |
| Publication date | 2017 |
| Article number | 103880P |
| DOIs | |
| Publication status | Published - 2017 |
| Event | SPIE Optical Engineering + Applications 2017 - San Diego Convention Center, San Diego, United States Duration: 6 Aug 2017 → 10 Aug 2017 http://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/optics-and-photonics-2017 |
Conference
| Conference | SPIE Optical Engineering + Applications 2017 |
|---|---|
| Location | San Diego Convention Center |
| Country/Territory | United States |
| City | San Diego |
| Period | 06/08/2017 → 10/08/2017 |
| Internet address |
| Series | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| ISSN | 0277-786X |
Keywords
- Computed tomography
- Spectral CT
- X-ray scattering
- MOnte Carlo simulations
- Scattered radiation
- Fan beam CT
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