A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging

Giovanni Fevola, Erik Bergbäck Knudsen, Tiago Ramos, Dina Carbone, Jens Wenzel Andreasen*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

17 Downloads (Pure)

Abstract

Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.
Original languageEnglish
JournalJournal of Synchrotron Radiation
Volume27
Issue number1
Pages (from-to)134-145
ISSN0909-0495
DOIs
Publication statusPublished - 2020

Cite this

@article{a44cfd18911e4e1995737973070f11d2,
title = "A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging",
abstract = "Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.",
author = "Giovanni Fevola and {Bergb{\"a}ck Knudsen}, Erik and Tiago Ramos and Dina Carbone and Andreasen, {Jens Wenzel}",
year = "2020",
doi = "10.1107/s1600577519014425",
language = "English",
volume = "27",
pages = "134--145",
journal = "Journal of Synchrotron Radiation",
issn = "0909-0495",
publisher = "Wiley-Blackwell",
number = "1",

}

A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging. / Fevola, Giovanni; Bergbäck Knudsen, Erik; Ramos, Tiago; Carbone, Dina; Andreasen, Jens Wenzel.

In: Journal of Synchrotron Radiation, Vol. 27, No. 1, 2020, p. 134-145.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging

AU - Fevola, Giovanni

AU - Bergbäck Knudsen, Erik

AU - Ramos, Tiago

AU - Carbone, Dina

AU - Andreasen, Jens Wenzel

PY - 2020

Y1 - 2020

N2 - Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.

AB - Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.

U2 - 10.1107/s1600577519014425

DO - 10.1107/s1600577519014425

M3 - Journal article

VL - 27

SP - 134

EP - 145

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 1

ER -