A Monte Carlo approach for simulating the propagation of partially coherent x-ray beams

A. Prodi, Erik Bergbäck Knudsen, Peter Kjær Willendrup, Søren Schmidt, C. Ferrero, Robert Feidenhans'l, Kim Lefmann

    Research output: Contribution to journalConference articleResearchpeer-review

    Abstract

    Advances at SR sources in the generation of nanofocused beams with a high degree of transverse coherence call for effective techniques to simulate the propagation of partially coherent X-ray beams through complex optical systems in order to characterize how coherence properties such as the mutual coherence function (MCF) are propagated to the exit plane. Here we present an approach based on Monte Carlo sampling of the Green function. A Gauss-Shell Stochastic Source with arbitrary spatial coherence is synthesized by means of the Gaussian copula statistical tool. The Green function is obtained by sampling Huygens-Fresnel waves with Monte Carlo methods and is used to propagate each source realization to the detector plane. The sampling is implemented with a modified Monte Carlo ray tracing scheme where the optical path of each generated ray is stored. Such information is then used in the summation of the generated rays at the observation plane to account for coherence properties. This approach is used to simulate simple models of propagation in free space and with reflective and refractive optics. © 2011 COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
    Original languageEnglish
    JournalProceedings of SPIE--the international society for optical engineering
    Volume8141
    Issue number1
    Pages (from-to)814108
    ISSN0277-786X
    DOIs
    Publication statusPublished - 2011
    EventAdvances in Computational Methods for X-Ray Optics II - San Diego, CA, United States
    Duration: 21 Aug 201125 Aug 2011

    Conference

    ConferenceAdvances in Computational Methods for X-Ray Optics II
    CountryUnited States
    CitySan Diego, CA
    Period21/08/201125/08/2011

    Keywords

    • Materials characterization and modelling

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