A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen

Marco Beleggia; R. Capelli; G. Pozzi

doi:10.1080/01418630008221974

A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen

Marco Beleggia, R. Capelli, G. Pozzi

Universitá di Bologna

Research output: Contribution to journal › Conference article › Research › peer-review

Abstract

An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them

Original language	English
Journal	Philosophical Magazine
Volume	80
Issue number	5
Pages (from-to)	1071-1082
Number of pages	12
ISSN	1478-6435
DOIs	https://doi.org/10.1080/01418630008221974
Publication status	Published - 2000
Externally published	Yes
Event	1st International Workshop on Semiconducting and Superconducting Materials - Turin, Italy Duration: 17 Feb 1999 → 18 Feb 1999 Conference number: 1

Workshop

Workshop	1st International Workshop on Semiconducting and Superconducting Materials
Number	1
Country/Territory	Italy
City	Turin
Period	17/02/1999 → 18/02/1999

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title = "A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen",

abstract = "An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them",

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AU - Beleggia, Marco

AU - Capelli, R.

AU - Pozzi, G.

N1 - Conference code: 1

PY - 2000

Y1 - 2000

N2 - An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them

AB - An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them

U2 - 10.1080/01418630008221974

DO - 10.1080/01418630008221974

M3 - Conference article

SN - 1478-6435

VL - 80

SP - 1071

EP - 1082

JO - Philosophical Magazine

JF - Philosophical Magazine

IS - 5

T2 - 1st International Workshop on Semiconducting and Superconducting Materials

Y2 - 17 February 1999 through 18 February 1999

ER -

A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen

Abstract

Workshop

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