A method to characterize the roughness of 2-D line features: recrystallization boundaries

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Abstract

A method is presented, which allows quantification of the roughness of nonplanar boundaries of objects for which the neutral plane is not known. The method provides quantitative descriptions of both the local and global characteristics. How the method can be used to estimate the sizes of rough features and local curvatures is also presented. The potential of the method is illustrated by quantification of the roughness of two recrystallization boundaries in a pure Al specimen characterized by scanning electron microscopy.
Original languageEnglish
JournalJournal of Microscopy
Volume265
Issue number3
Pages (from-to)313–321
ISSN0022-2720
DOIs
Publication statusPublished - 2017

Keywords

  • Area integral invariant
  • Boundary
  • Curvature
  • Electron backscatter diffraction
  • Recrystallization
  • Roughness

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