A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

Original language	English
Title of host publication	Interfacial engineering for optimized properties 3
Editors	C.A. Schuh, M. Kumar, V. Randle, C.B. Carter
Place of Publication	Warrendale, PA (US)
Publisher	MRS
Publication date	2004
Publication status	Published - 2004
Event	MRS Spring meeting 2004. Symposium N - San Francisco, United States Duration: 12 Apr 2004 → 16 Apr 2004

Conference	MRS Spring meeting 2004. Symposium N
Country/Territory	United States
City	San Francisco
Period	12/04/2004 → 16/04/2004

OpenUrl availability

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title = "A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope",

keywords = "5-I nano",

author = "S{\o}ren Schmidt and {Juul Jensen}, D.",

year = "2004",

language = "English",

editor = "C.A. Schuh and M. Kumar and V. Randle and C.B. Carter",

booktitle = "Interfacial engineering for optimized properties 3",

publisher = "MRS",

note = "MRS Spring meeting 2004. Symposium N ; Conference date: 12-04-2004 Through 16-04-2004",

}

A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope. / Schmidt, Søren; Juul Jensen, D.
Interfacial engineering for optimized properties 3. ed. / C.A. Schuh; M. Kumar; V. Randle; C.B. Carter. Warrendale, PA (US): MRS, 2004.

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research

TY - GEN

T1 - A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope

AU - Schmidt, Søren

AU - Juul Jensen, D.

PY - 2004

Y1 - 2004

KW - 5-I nano

M3 - Article in proceedings

BT - Interfacial engineering for optimized properties 3

A2 - Schuh, C.A.

A2 - Kumar, M.

A2 - Randle, V.

A2 - Carter, C.B.

PB - MRS

CY - Warrendale, PA (US)

T2 - MRS Spring meeting 2004. Symposium N

Y2 - 12 April 2004 through 16 April 2004

ER -