A MEANS FOR CALIBRATING A MICROSCOPE, A METHOD OF PREPARING THE MEANS AND A METHOD OF CALIBRATING A MICROSCOPE

Hans Nørgaard Hansen (Inventor), Leonardo De Chiffre (Inventor), Andy Horsewell (Inventor), Rene Sobiecki (Inventor), Paolo Bariani (Inventor)

    Research output: Patent

    Abstract

    A means or artefact for calibrating the height/depth or Z axis of a microscope, such as a confocal microscope, an interference microscope or a Scanning Electron Microscope. The artefact comprises a number of tapering or pie-shaped, parallel surfaces each extending from a central axis, whereby all surfaces and heights are visible independently of the magnification of the microscope. Thus, the full height range may be calibrated and the linearity thereof checked independently of the magnification.
    Original languageEnglish
    Patent numberWO2005116716
    Filing date08/12/2005
    CountryInternational Bureau of the World Intellectual Property Organization (WIPO)
    Publication statusPublished - 2005

    Bibliographical note

    International application published under the World Intellectual Property Organization (WIPO)

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