A greedy method for reconstructing polycrystals from three-dimensional X-ray diffraction data

Arun Kumar Kulshreshth, Andreas Alpers, Gabor T. Herman, Erik Knudsen, Lajos Rodek, Henning Friis Poulsen

    Research output: Contribution to journalJournal articleResearchpeer-review

    Abstract

    An iterative search method is proposed for obtaining orientation maps inside polycrystals from three-dimensional X-ray diffraction (3DXRD) data. In each step, detector pixel intensities are calculated by a forward model based on the current estimate of the orientation map. The pixel at which the experimentally measured value most exceeds the simulated one is identified. This difference can only be reduced by changing the current estimate at a location from a relatively small subset of all possible locations in the estimate and, at each such location, an increase at the identified pixel can only be achieved by changing the orientation in only a few possible ways. The method selects the location/orientation pair indicated as best by a function that measures data consistency combined with prior information on orientation maps. The superiority of the method to a previously published forward projection Monte Carlo optimization is demonstrated on simulated data.
    Original languageEnglish
    JournalInverse Problems and Imaging
    Volume3
    Issue number1
    Pages (from-to)69-85
    ISSN1930-8337
    DOIs
    Publication statusPublished - 2009

    Keywords

    • Materials characterization and modelling
    • Materials research

    Cite this

    Kulshreshth, Arun Kumar ; Alpers, Andreas ; Herman, Gabor T. ; Knudsen, Erik ; Rodek, Lajos ; Poulsen, Henning Friis. / A greedy method for reconstructing polycrystals from three-dimensional X-ray diffraction data. In: Inverse Problems and Imaging. 2009 ; Vol. 3, No. 1. pp. 69-85.
    @article{c43bd046ffb94803947abc5d31987a7a,
    title = "A greedy method for reconstructing polycrystals from three-dimensional X-ray diffraction data",
    abstract = "An iterative search method is proposed for obtaining orientation maps inside polycrystals from three-dimensional X-ray diffraction (3DXRD) data. In each step, detector pixel intensities are calculated by a forward model based on the current estimate of the orientation map. The pixel at which the experimentally measured value most exceeds the simulated one is identified. This difference can only be reduced by changing the current estimate at a location from a relatively small subset of all possible locations in the estimate and, at each such location, an increase at the identified pixel can only be achieved by changing the orientation in only a few possible ways. The method selects the location/orientation pair indicated as best by a function that measures data consistency combined with prior information on orientation maps. The superiority of the method to a previously published forward projection Monte Carlo optimization is demonstrated on simulated data.",
    keywords = "Materials characterization and modelling, Materials research, Materialeforskning, Materialekarakterisering og materialemodellering",
    author = "Kulshreshth, {Arun Kumar} and Andreas Alpers and Herman, {Gabor T.} and Erik Knudsen and Lajos Rodek and Poulsen, {Henning Friis}",
    year = "2009",
    doi = "10.3934/ipi.2009.3.69",
    language = "English",
    volume = "3",
    pages = "69--85",
    journal = "Inverse Problems and Imaging",
    issn = "1930-8337",
    publisher = "American Institute of Mathematical Sciences",
    number = "1",

    }

    A greedy method for reconstructing polycrystals from three-dimensional X-ray diffraction data. / Kulshreshth, Arun Kumar; Alpers, Andreas; Herman, Gabor T.; Knudsen, Erik; Rodek, Lajos; Poulsen, Henning Friis.

    In: Inverse Problems and Imaging, Vol. 3, No. 1, 2009, p. 69-85.

    Research output: Contribution to journalJournal articleResearchpeer-review

    TY - JOUR

    T1 - A greedy method for reconstructing polycrystals from three-dimensional X-ray diffraction data

    AU - Kulshreshth, Arun Kumar

    AU - Alpers, Andreas

    AU - Herman, Gabor T.

    AU - Knudsen, Erik

    AU - Rodek, Lajos

    AU - Poulsen, Henning Friis

    PY - 2009

    Y1 - 2009

    N2 - An iterative search method is proposed for obtaining orientation maps inside polycrystals from three-dimensional X-ray diffraction (3DXRD) data. In each step, detector pixel intensities are calculated by a forward model based on the current estimate of the orientation map. The pixel at which the experimentally measured value most exceeds the simulated one is identified. This difference can only be reduced by changing the current estimate at a location from a relatively small subset of all possible locations in the estimate and, at each such location, an increase at the identified pixel can only be achieved by changing the orientation in only a few possible ways. The method selects the location/orientation pair indicated as best by a function that measures data consistency combined with prior information on orientation maps. The superiority of the method to a previously published forward projection Monte Carlo optimization is demonstrated on simulated data.

    AB - An iterative search method is proposed for obtaining orientation maps inside polycrystals from three-dimensional X-ray diffraction (3DXRD) data. In each step, detector pixel intensities are calculated by a forward model based on the current estimate of the orientation map. The pixel at which the experimentally measured value most exceeds the simulated one is identified. This difference can only be reduced by changing the current estimate at a location from a relatively small subset of all possible locations in the estimate and, at each such location, an increase at the identified pixel can only be achieved by changing the orientation in only a few possible ways. The method selects the location/orientation pair indicated as best by a function that measures data consistency combined with prior information on orientation maps. The superiority of the method to a previously published forward projection Monte Carlo optimization is demonstrated on simulated data.

    KW - Materials characterization and modelling

    KW - Materials research

    KW - Materialeforskning

    KW - Materialekarakterisering og materialemodellering

    U2 - 10.3934/ipi.2009.3.69

    DO - 10.3934/ipi.2009.3.69

    M3 - Journal article

    VL - 3

    SP - 69

    EP - 85

    JO - Inverse Problems and Imaging

    JF - Inverse Problems and Imaging

    SN - 1930-8337

    IS - 1

    ER -