A granular modeling method for non-uniform panel degradation based on I–V characterization and electroluminescence imaging

Martin Garaj*, Henry Shu Hung Chung, Sergiu Spataru, Alan Wai Lun Lo, Huai Wang

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

A new model of photovoltaic (PV) panel is proposed. The model precisely replicates sub-cell level degradation, such as cracks and interconnect failures, and reproduces their effect at the panel level I–V characteristic. Moreover, a regression method is proposed, which infers the model's parameters from combination of electroluminescent (EL) image and degraded I–V characteristic. The combination of quantitative (EL image) and qualitative (I–V characteristic) enables to characterize the degradation of the cells embedded in the PV panel, without physical access to the cells. The proposed model and the regression problem is experimentally verified on a set of 3 single cell measurements and a set of 4 crystalline PV panels with various levels of degradation.

Original languageEnglish
JournalSolar Energy
Volume227
Pages (from-to)162-178
Number of pages17
ISSN0038-092X
DOIs
Publication statusPublished - Oct 2021

Bibliographical note

Funding Information:
The work presented in this publication was possible due to generous cooperation of companies Kmetrics and SolarTester, who shared test-bed measurements for testing the proposed method. The work was supported by a grant from the Innovation Fund Denmark through the project APETT with no.: 6154-00010B and Innovation and Technology Fund, Hong Kong through the project #ITS/308/15.

Publisher Copyright:
© 2021 International Solar Energy Society

Keywords

  • Degradation modeling
  • Evolutionary algorithm
  • Preventive diagnostics

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