A Fourier approach to fields and electron optical phase-shifts calculations

M. Beleggia, P.F. Fazzini, G. Pozzi

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The Fourier method is applied to calculate fields and electron optical phase shifts in specimens having long-range electromagnetic fields, like reverse biased p–n junctions or stripe magnetic domains. It is shown that this approach not only allows to take into account rather easily the effect of the fringing fields protruding in the space around the specimen, but also to obtain solutions to interesting models in analytical form.
Original languageEnglish
JournalULTRAMICROSCOPY
Volume96
Issue number1
Pages (from-to)93-103
Number of pages11
ISSN0304-3991
DOIs
Publication statusPublished - 2003
Externally publishedYes

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