A Fourier approach to fields and electron optical phase-shifts calculations

M. Beleggia; P.F. Fazzini; G. Pozzi

doi:10.1016/S0304-3991(02)00402-3

A Fourier approach to fields and electron optical phase-shifts calculations

M. Beleggia, P.F. Fazzini, G. Pozzi

Research output: Contribution to journal › Journal article › Research › peer-review

Abstract

The Fourier method is applied to calculate fields and electron optical phase shifts in specimens having long-range electromagnetic fields, like reverse biased p–n junctions or stripe magnetic domains. It is shown that this approach not only allows to take into account rather easily the effect of the fringing fields protruding in the space around the specimen, but also to obtain solutions to interesting models in analytical form.

Original language	English
Journal	Ultramicroscopy
Volume	96
Issue number	1
Pages (from-to)	93-103
Number of pages	11
ISSN	0304-3991
DOIs	https://doi.org/10.1016/S0304-3991(02)00402-3
Publication status	Published - 2003
Externally published	Yes

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abstract = "The Fourier method is applied to calculate fields and electron optical phase shifts in specimens having long-range electromagnetic fields, like reverse biased p–n junctions or stripe magnetic domains. It is shown that this approach not only allows to take into account rather easily the effect of the fringing fields protruding in the space around the specimen, but also to obtain solutions to interesting models in analytical form.",

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AU - Fazzini, P.F.

AU - Pozzi, G.

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AB - The Fourier method is applied to calculate fields and electron optical phase shifts in specimens having long-range electromagnetic fields, like reverse biased p–n junctions or stripe magnetic domains. It is shown that this approach not only allows to take into account rather easily the effect of the fringing fields protruding in the space around the specimen, but also to obtain solutions to interesting models in analytical form.

U2 - 10.1016/S0304-3991(02)00402-3

DO - 10.1016/S0304-3991(02)00402-3

M3 - Journal article

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VL - 96

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EP - 103

JO - Ultramicroscopy

JF - Ultramicroscopy

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ER -

A Fourier approach to fields and electron optical phase-shifts calculations

Abstract

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