Abstract
I present an analytical expression for the image intensity of a phase object visualized in Zernike phase contrast mode. The formula is valid for periodic and non-periodic weak and strong objects, and accounts for the effects of finite illumination. The expression provided is intended as a generalization of the standard reference formula given in the Born and Wolf [Principles of Optics, sixth ed., Pergamon Press, New York, 1980, p. 427] textbook as well as of the formalism employed to evaluate imaging doses in Zernike mode [M. Malac, M. Beleggia, R. Egerton, Y. Zhu, Ultramicroscopy 108 (2008) 126]. I illustrate the usefulness of the improved expression by means of three examples: a sinusoidal phase grating, a Gaussian object, and a phase step. The optimal Zernike phase angle yielding maximum image contrast is found to be object-dependent and not necessarily equal to π/2. Phase plate optimization criteria are derived and presented for two of the examples considered.
Original language | English |
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Journal | Ultramicroscopy |
Volume | 108 |
Issue number | 9 |
Pages (from-to) | 953-958 |
Number of pages | 6 |
ISSN | 0304-3991 |
DOIs | |
Publication status | Published - 2008 |
Externally published | Yes |
Keywords
- Zernike phase plates
- Phase contrast
- Phase objects
- Electron microscopy